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Clustering by pattern similarity in large data sets
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Proceedings of the 2002 ACM SIGMOD international conference on Management of data table of contents
Madison, Wisconsin
SESSION: Research sessions: data mining table of contents
Pages: 394 - 405  
Year of Publication: 2002
ISBN:1-58113-497-5
Authors
Haixun Wang  IBM T. J. Watson Research Center, Hawthorne, NY
Wei Wang  IBM T. J. Watson Research Center, Road, Hawthorne, NY
Jiong Yang  IBM T. J. Watson Research Center, Road, Hawthorne, NY
Philip S. Yu  IBM T. J. Watson Research Center, Road, Hawthorne, NY
Sponsor
SIGMOD: ACM Special Interest Group on Management of Data
Publisher
ACM  New York, NY, USA
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ABSTRACT

Clustering is the process of grouping a set of objects into classes of similar objects. Although definitions of similarity vary from one clustering model to another, in most of these models the concept of similarity is based on distances, e.g., Euclidean distance or cosine distance. In other words, similar objects are required to have close values on at least a set of dimensions. In this paper, we explore a more general type of similarity. Under the pCluster model we proposed, two objects are similar if they exhibit a coherent pattern on a subset of dimensions. For instance, in DNA microarray analysis, the expression levels of two genes may rise and fall synchronously in response to a set of environmental stimuli. Although the magnitude of their expression levels may not be close, the patterns they exhibit can be very much alike. Discovery of such clusters of genes is essential in revealing significant connections in gene regulatory networks. E-commerce applications, such as collaborative filtering, can also benefit from the new model, which captures not only the closeness of values of certain leading indicators but also the closeness of (purchasing, browsing, etc.) patterns exhibited by the customers. Our paper introduces an effective algorithm to detect such clusters, and we perform tests on several real and synthetic data sets to show its effectiveness.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

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CITED BY  53

Collaborative Colleagues:
Haixun Wang: colleagues
Wei Wang: colleagues
Jiong Yang: colleagues
Philip S. Yu: colleagues