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Field testing for cosmic ray soft errors in semiconductor memories
Source IBM Journal of Research and Development archive
Volume 40 ,  Issue 1  (January 1996) table of contents
Special issue: terrestrial cosmic rays and soft errors
Pages: 41 - 50  
Year of Publication: 1996
ISSN:0018-8646
Authors
T. J. O'Gorman
J. M. Ross
A. H. Taber
J. F. Ziegler
H. P. Muhlfeld
C. J. Montrose
H. W. Curtis
J. L. Walsh
Publisher
IBM Corp.  Riverton, NJ, USA
Bibliometrics
Downloads (6 Weeks): n/a,   Downloads (12 Months): n/a,   Citation Count: 17
Additional Information:

cited by   index terms   collaborative colleagues  

Tools and Actions: Review this Article  

CITED BY  17
Ganesan Umanesan , Eiji Fujiwara, A Class of Random Multiple Bits in a Byte Error Correcting and Single Byte Error Detecting (S_t/b EC-S_bED) Codes, IEEE Transactions on Computers, v.52 n.7, p.835-847, July 2003
Tanay Karnik , Peter Hazucha , Jagdish Patel, Characterization of Soft Errors Caused by Single Event Upsets in CMOS Processes, IEEE Transactions on Dependable and Secure Computing, v.1 n.2, p.128-143, April 2004
Jean-Guillaume Dumas , Clément Pernet , Zhendong Wan, Efficient computation of the characteristic polynomial, Proceedings of the 2005 international symposium on Symbolic and algebraic computation, p.140-147, July 24-27, 2005, Beijing, China
George A. Reis , Jonathan Chang , Neil Vachharajani , Ram Rangan , David I. August , Shubhendu S. Mukherjee, Software-controlled fault tolerance, ACM Transactions on Architecture and Code Optimization (TACO), v.2 n.4, p.366-396, December 2005
Jacques Dubrois , Jean-Guillaume Dumas, Efficient polynomial time algorithms computing industrial-strength primitive roots, Information Processing Letters, v.97 n.2, p.41-45, 31 January 2006
Edson Borin , Cheng Wang , Youfeng Wu , Guido Araujo, Dynamic binary control-flow errors detection, ACM SIGARCH Computer Architecture News, v.33 n.5, December 2005
Goutam Kumar Saha, Software based fault tolerance: a survey, Ubiquity, v.7 n.25, p.1-1, July 5, 2006 - July 10, 2006
Xin Li , Kai Shen , Michael C. Huang , Lingkun Chu, A memory soft error measurement on production systems, 2007 USENIX Annual Technical Conference on Proceedings of the USENIX Annual Technical Conference, p.1-6, June 17-22, 2007, Santa Clara, CA
David Walker , Lester Mackey , Jay Ligatti , George A. Reis , David I. August, Static typing for a faulty lambda calculus, ACM SIGPLAN Notices, v.41 n.9, September 2006
Frances Perry , Lester Mackey , George A. Reis , Jay Ligatti , David I. August , David Walker, Fault-tolerant typed assembly language, ACM SIGPLAN Notices, v.42 n.6, June 2007
Xin Li , Michael C. Huang , Kai Shen , Lingkun Chu, An empirical study of memory hardware errors in a server farm, Proceedings of the 3rd conference on Third Workshop on Hot Topics in System Dependability, p.13-13, June 26, 2007, Edinburgh, UK
Edson Borin , Cheng Wang , Youfeng Wu , Guido Araujo, Software-Based Transparent and Comprehensive Control-Flow Error Detection, Proceedings of the International Symposium on Code Generation and Optimization, p.333-345, March 26-29, 2006
George A. Reis , Jonathan Chang , Neil Vachharajani , Ram Rangan , David I. August , Shubhendu S. Mukherjee, Design and Evaluation of Hybrid Fault-Detection Systems, ACM SIGARCH Computer Architecture News, v.33 n.2, p.148-159, May 2005
George A. Reis , Jonathan Chang , David I. August, Automatic Instruction-Level Software-Only Recovery, IEEE Micro, v.27 n.1, p.36-47, January 2007
T. J. Dell, System RAS implications of DRAM soft errors, IBM Journal of Research and Development, v.52 n.3, p.307-314, May 2008
Kazuyoshi Suzuki , Toshihiko Kashiyama , Eiji Fujiwara, A General Class of M-Spotty Byte Error Control Codes, IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences, v.E90-A n.7, p.1418-1427, July 2007
Bianca Schroeder , Eduardo Pinheiro , Wolf-Dietrich Weber, DRAM errors in the wild: a large-scale field study, Proceedings of the eleventh international joint conference on Measurement and modeling of computer systems, June 15-19, 2009, Seattle, WA, USA

INDEX TERMS

Primary Classification:
  B. Hardware
  B.7 INTEGRATED CIRCUITS

Additional Classification:
  B. Hardware
  B.3 MEMORY STRUCTURES
  B.m MISCELLANEOUS
      Subjects: Design management


General Terms:
Design, Experimentation, Measurement, Verification

Collaborative Colleagues:
T. J. O'Gorman: colleagues
J. M. Ross: colleagues
A. H. Taber: colleagues
J. F. Ziegler: colleagues
H. P. Muhlfeld: colleagues
C. J. Montrose: colleagues
H. W. Curtis: colleagues
J. L. Walsh: colleagues

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