APT: an area-performance-testability driven placement algorithm

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APT: an area-performance-testability driven placement algorithm

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Annual ACM IEEE Design Automation Conference archive
Proceedings of the 29th ACM/IEEE Design Automation Conference table of contents

Anaheim, California, United States

Pages: 141 - 146

Year of Publication: 1992

ISBN:0-89791-516-X

Authors

S. Kim	Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois, Urbana, IL
P. Banerjee	Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois, Urbana, IL
V. Chickermane	Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois, Urbana, IL
J. H. Patel	Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois, Urbana, IL

Sponsors

EDAC : Electronic Design Automation Consortium
IEEE-CS : Computer Society
IEEE-CAS : Circuits & Systems
SIGDA: ACM Special Interest Group on Design Automation

Publisher

IEEE Computer Society Press Los Alamitos, CA, USA

Bibliometrics

Downloads (6 Weeks): 7, Downloads (12 Months): 8, Citation Count: 1

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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

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