Combining dictionary coding and LFSR reseeding for test data compression

ABSTRACT

In this paper we describe a method to combine dictionary coding and partial LFSR reseeding to improve the ompression efficiency for test data compression. We also present a fast matrix calculation method which significantly reduces the computation time to find a solution for partial LFSR reseeding. Experimental results on ISCAS89 benchmark circuits show that our approach is better than either dictionary coding or LFSR reseeding, and outperforms several test data compression methods proposed recently.

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INDEX TERMS

Primary Classification:
  B. Hardware
  B.8 Performance and Reliability
      B.8.1 Reliability, Testing, and Fault-Tolerance

General Terms:
Algorithms, Design

Keywords:
VLSI test, built-In self test