ACM Home Page
Please provide us with feedback. Feedback
Statistical timing analysis in sequential circuit for on-chip global interconnect pipelining
Full text PdfPdf (182 KB)
Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 41st annual Design Automation Conference table of contents
San Diego, CA, USA
SESSION: Noise-tolerant design and analysis techniques table of contents
Pages: 904 - 907  
Year of Publication: 2004
ISBN:1-58113-828-8
Authors
Lizheng Zhang  University of Wisconsin, Madison, WI
Yuhen Hu  University of Wisconsin, Madison, WI
Charlie, Chungping Chen  National Taiwan University, Taipei, Taiwan
Sponsors
ACM: Association for Computing Machinery
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 4,   Downloads (12 Months): 29,   Citation Count: 7
Additional Information:

abstract   references   cited by   index terms   collaborative colleagues  

Tools and Actions: Request Permissions Request Permissions    Review this Article  
DOI Bookmark: Use this link to bookmark this Article: http://doi.acm.org/10.1145/996566.996806
What is a DOI?

ABSTRACT

With deep-sub-micron (DSM) technology, statistical timing analysis becomes increasingly crucial to characterize signal transmission over global interconnect wires. In this paper, a novel statistical timing analysis approach has been developed to analyze the behavior of two important pipelined architectures for multiple clock-cycle global interconnect, namely, the flip-flop inserted global wire and the latch inserted global wire. We present analytical formula that is based on parameters obtained using Monte Carlo simulation. These results enable a global interconnect designer to explore design trade-offs between clock frequency and probability of bit-error during data transmission.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

1
 
2
K. Banerjee and A. Mehrotra, "A power-optimal repeater insertion methodology for global interconnects in nanometer designs," IEEE Transactions on Electron Devices, vol. 49, no. 11, pp. 2001 --2007, Nov 2002.
 
3
4
 
5
6
 
7
 
8
9
10
11
 
12
A. Agarwal, V. Zolotov, and D. Blaauw, "Statistical timing analysis using bounds and selective enumeration," IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 22, no. 9, pp. 1243--1260, Sept 2003.
 
13
 
14
H. Jyu, S. Malik, S. Devadas, and K. Keutzer, "Statistical timing analysis of combinational logic circuits," Very Large Scale Integration (VLSI) Systems, IEEE Transactions on, vol. 1, no. 2, pp. 126--137, June 1993.
 
15
 
16
R. Brawhear, N. Menezes, C. Oh, L. Pillage, and M. Mercer, "Predicting circuit performance using circuit-level statistical timing analysis," European Design and Test Conference, 1994. EDAC, The European Conference on Design Automation. ETC European Test Conference. EUROASIC, The European Event in ASIC Design, Proceedings., pp. 332--337, Mar 1994.
 
17
 
18
 
19
 
20
N. Kurd, J. Barkatullah, R. Dizon, T. Fletcher, and P. Madland, "A multigigahertz clocking scheme for the pentium(r) 4 microprocessor," IEEE Journal of Solid-State Circuits, vol. 36, no. 11, pp. 1647--1653, Nov. 2001.

CITED BY  7

Collaborative Colleagues:
Lizheng Zhang: colleagues
Yuhen Hu: colleagues
Charlie, Chungping Chen: colleagues