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Power minimization using simultaneous gate sizing, dual-Vdd and dual-Vth assignment
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Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 41st annual Design Automation Conference table of contents
San Diego, CA, USA
SESSION: Leakage power optimization table of contents
Pages: 783 - 787  
Year of Publication: 2004
ISBN:1-58113-828-8
Authors
Ashish Srivastava  University of Michigan, Ann Arbor, MI
Dennis Sylvester  University of Michigan, Ann Arbor, MI
David Blaauw  University of Michigan, Ann Arbor, MI
Sponsors
ACM: Association for Computing Machinery
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 6,   Downloads (12 Months): 52,   Citation Count: 10
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ABSTRACT

We develop an approach to minimize total power in a dual-Vdd and dual-Vth design. The algorithm runs in two distinct phases. The first phase relies on upsizing to create slack and maximize low Vdd assignments in a backward topological manner. The second phase proceeds in a forward topological fashion and both sizes and re-assigns gates to high Vdd to enable significant static power savings through high Vth assignment. The proposed algorithm is implemented and tested on a set of combinational benchmark circuits. A comparison with traditional CVS and dual-Vth/sizing algorithms demonstrate the advantage of the algorithm over a range of activity factors, including an average power reduction of 30% (50%) at high (nominal) primary input activities.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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CITED BY  10

Collaborative Colleagues:
Ashish Srivastava: colleagues
Dennis Sylvester: colleagues
David Blaauw: colleagues