| Variational delay metrics for interconnect timing analysis |
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Annual ACM IEEE Design Automation Conference
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Proceedings of the 41st annual Design Automation Conference
table of contents
San Diego, CA, USA
SESSION: Model order reduction and variational techniques for parasitic analysis
table of contents
Pages: 381 - 384
Year of Publication: 2004
ISBN:1-58113-828-8
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Authors
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Kanak Agarwal
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University of Michigan, Ann Arbor, MI
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Dennis Sylvester
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University of Michigan, Ann Arbor, MI
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David Blaauw
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University of Michigan, Ann Arbor, MI
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Frank Liu
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IBM Research, Austin, TX
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Sani Nassif
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IBM Research, Austin, TX
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Sarma Vrudhula
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University of Arizona, Tucson, AZ
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Downloads (6 Weeks): 8, Downloads (12 Months): 42, Citation Count: 29
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ABSTRACT
In this paper we develop an approach to model interconnect delay under process variability for timing analysis and physical design optimization. The technique allows for closed-form computation of interconnect delay probability density functions (PDFs) given variations in relevant process parameters such as linewidth, metal thickness, and dielectric thickness. We express the resistance and capacitance of a line as a linear function of random variables and then use these to compute circuit moments. Finally, these variability-aware moments are used in known closed-form delay metrics to compute interconnect delay PDFs. We compare the approach to SPICE based Monte Carlo simulations and report an error in mean and standard deviation of delay of 1% and 4% on average, respectively.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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CITED BY 29
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Hanif Fatemi , Soroush Abbaspour , Massoud Pedram , Amir H. Ajami , Emre Tuncer, SACI: statistical static timing analysis of coupled interconnects, Proceedings of the 16th ACM Great Lakes symposium on VLSI, April 30-May 01, 2006, Philadelphia, PA, USA
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Alexander V. Mitev , Michael Marefat , Dongsheng Ma , Janet Wang, Principle hessian direction based parameter reduction forinterconnect networks with process variation, Proceedings of the 2007 international workshop on System level interconnect prediction, March 17-18, 2007, Austin, Texas, USA
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Francisco Gilabert , Simone Medardoni , Davide Bertozzi , Luca Benini , María Engracia Gomez , Pedro Lopez , José Duato, Exploring High-Dimensional Topologies for NoC Design Through an Integrated Analysis and Synthesis Framework, Proceedings of the Second ACM/IEEE International Symposium on Networks-on-Chip, p.107-116, April 07-10, 2008
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