| A linear fractional transform (LFT) based model for interconnect parametric uncertainty |
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Annual ACM IEEE Design Automation Conference
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Proceedings of the 41st annual Design Automation Conference
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San Diego, CA, USA
SESSION: Model order reduction and variational techniques for parasitic analysis
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Pages: 375 - 380
Year of Publication: 2004
ISBN:1-58113-828-8
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Authors
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Janet M. Wang
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University of Arizona at Tucson, Tucson, AZ
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Omar A. Hafiz
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University of Arizona at Tucson, Tucson, AZ
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Jun Li
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ETOP Design Technology, Sunnyvale, CA
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Downloads (6 Weeks): 12, Downloads (12 Months): 31, Citation Count: 4
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ABSTRACT
As we scale toward nanometer technologies, the increase in interconnect parameter variations will bring significant performance variability. New design methodologies will emerge to facilitate construction of reliable systems from unreliable nanometer scale components. Such methodologies require new performance models which accurately capture the manufacturing realities. In this paper, we present a Linear Fractional Transform (LFT) based model for interconnect Parametric Uncertainty. This new model formulates the interconnect parameter uncertainty as a repeated scalar uncertainty structure. With the help of generalized Balanced Truncation Realization (BTR) based on Linear Matrix Inequalities (LMI's), the new model reduces the order of the original interconnect network while preserves the stability. This paper also shows that the LFT based model even guarantees passivity if the BTR reduction is based on solutions to a pair of Linear Matrix Inequalities (LMI's) which generalizes Lur'e equations.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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[doi> 10.1145/309847.309914]
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CITED BY 4
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Peng Li , Frank Liu , Xin Li , Lawrence T. Pileggi , Sani R. Nassif, Modeling Interconnect Variability Using Efficient Parametric Model Order Reduction, Proceedings of the conference on Design, Automation and Test in Europe, p.958-963, March 07-11, 2005
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