Routing architecture exploration for regular fabrics

ABSTRACT

In an effort to control the parameter variations and systematic yield problems that threaten the affordability of application-specific ICs, new forms of design regularity and structure have been proposed. For example, there has been speculation [6] that regular logic fabrics [1] based on regular geometry patterns [2] can offer tighter control of variations and greater control of systematic manufacturing failures. In this paper we describe a routing framework that accommodates arbitrary descriptions of regular and structured routing architectures. We further propose new regular routing architectures and explore the various performance vs. manufacturability trade-offs. Results demonstrate that a more regular, restricted routing architecture can provide a substantial advantage in terms of manufacturability and predictability while incurring a moderate performance penalty.

REFERENCES

• 1: L. Pileggi , H. Schmit , A. J. Strojwas , P. Gopalakrishnan , V. Kheterpal , A. Koorapaty , C. Patel , V. Rovner , K. Y. Tong, Exploring regular fabrics to optimize the performance-cost trade-off, Proceedings of the 40th conference on Design automation, June 02-06, 2003, Anaheim, CA, USA [doi>10.1145/775832.776031]
• 2: M. Palusinski, A. J. Strojwas and W. Maly, "Regularity in Physical Design", GSRC Workshop, Las Vages, June 2001.
• 3: A. J. Strojwas, "Process-Design Interaction Modeling Based Design For Manufacturability", Tutorial, DAC-2003.
• 4: http://www.easic.com, http://www.lightspeed.com
• 5: D.T. Blaauw et al, "Statistical Timing Analysis using Bounds and Selective Enumeration", IEEE Trans. on CAD of Integrated Circuits and Systems, Vol. 22, No.9, Sep 2003.
• 6: B. Tyrrell et al, "Investigation of the physical and practical limits of dense-only phase shift lithography for circuit feature definition", Society of Photo-Optical Instrumentation Engineers, October-2002.
• 7: Gonzales, Anthony J. et al, "Recent results in the application of e-beam direct-write lithography", Proc. SPIE Vol. 1089, p. 37.

INDEX TERMS

Primary Classification:
  B. Hardware
  B.7 INTEGRATED CIRCUITS
      B.7.2 Design Aids

General Terms:
Algorithms, Design, Experimentation

Keywords:
BEOL, regularity