ACM Home Page
Please provide us with feedback. Feedback
A stochastic approach To power grid analysis
Full text PdfPdf (312 KB)
Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 41st annual Design Automation Conference table of contents
San Diego, CA, USA
SESSION: Power grid design and analysis techniques table of contents
Pages: 171 - 176  
Year of Publication: 2004
ISBN:1-58113-828-8
Authors
Sanjay Pant  University of Michigan, Ann Arbor, MI
David Blaauw  University of Michigan, Ann Arbor, MI
Vladimir Zolotov  Motorola Inc., Austin, TX
Savithri Sundareswaran  Motorola Inc., Austin, TX
Rajendran Panda  Motorola Inc., Austin, TX
Sponsors
ACM: Association for Computing Machinery
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 8,   Downloads (12 Months): 31,   Citation Count: 8
Additional Information:

abstract   references   cited by   index terms   collaborative colleagues  

Tools and Actions: Request Permissions Request Permissions    Review this Article  
DOI Bookmark: Use this link to bookmark this Article: http://doi.acm.org/10.1145/996566.996616
What is a DOI?

ABSTRACT

Power supply integrity analysis is critical in modern high perfor-mance designs. In this paper, we propose a stochastic approach to obtain statistical information about the collective IR and LdI/dt drop in a power supply network. The currents drawn from the power grid by the blocks in a design are modelled as stochastic processes and their statistical information is extracted, including correlation infor-mation between blocks in both space and time. We then propose a method to propagate the statistical parameters of the block currents through the linear model of the power grid to obtain the mean and standard deviation of the voltage drops at any node in the grid. We show that the run time is linear with the length of the current wave-forms allowing for extensive vectors, up to millions of cycles, to be analyzed. We implemented the approach on a number of grids, including a grid from an industrial microprocessor and demonstrate its accuracy and efficiency. The proposed statistical analysis can be use to determine which portions of the grid are most likely to fail as well as to provide information for other analyses, such as statistical timing analysis.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

1
 
2
S. Taylor, "The challenge of designing global systems in UDSMCMOS," in Proc CICC, pp.429--435, 1999.
 
3
4
 
5
M. Zhao, R. V. Panda, S. S. Sapatnekar and D. Blaauw, "Hierarchical analysis of power distribution networks," in IEEE Trans. on CAD, pp. 159--168, 2002.
6
7
8
9
 
10
H. Kriplani, F. Najm, I. Hajj, "Pattern independent maximum cur-rent estimation in power and ground buses of CMOS VLSI circuits," in IEEE Trans. on CAD, vol. 14. no. 8, pp. 998--1012, 1995.
 
11
 
12
George R. Cooper, Clare D. McGillem, Probabilistic Methods of Signal and System Analysis, Oxford Series, 1998.

CITED BY  9

Collaborative Colleagues:
Sanjay Pant: colleagues
David Blaauw: colleagues
Vladimir Zolotov: colleagues
Savithri Sundareswaran: colleagues
Rajendran Panda: colleagues