| A stochastic approach To power grid analysis |
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Annual ACM IEEE Design Automation Conference
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Proceedings of the 41st annual Design Automation Conference
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San Diego, CA, USA
SESSION: Power grid design and analysis techniques
table of contents
Pages: 171 - 176
Year of Publication: 2004
ISBN:1-58113-828-8
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Authors
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Sanjay Pant
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University of Michigan, Ann Arbor, MI
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David Blaauw
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University of Michigan, Ann Arbor, MI
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Vladimir Zolotov
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Motorola Inc., Austin, TX
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Savithri Sundareswaran
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Motorola Inc., Austin, TX
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Rajendran Panda
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Motorola Inc., Austin, TX
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Downloads (6 Weeks): 8, Downloads (12 Months): 31, Citation Count: 8
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ABSTRACT
Power supply integrity analysis is critical in modern high perfor-mance designs. In this paper, we propose a stochastic approach to obtain statistical information about the collective IR and LdI/dt drop in a power supply network. The currents drawn from the power grid by the blocks in a design are modelled as stochastic processes and their statistical information is extracted, including correlation infor-mation between blocks in both space and time. We then propose a method to propagate the statistical parameters of the block currents through the linear model of the power grid to obtain the mean and standard deviation of the voltage drops at any node in the grid. We show that the run time is linear with the length of the current wave-forms allowing for extensive vectors, up to millions of cycles, to be analyzed. We implemented the approach on a number of grids, including a grid from an industrial microprocessor and demonstrate its accuracy and efficiency. The proposed statistical analysis can be use to determine which portions of the grid are most likely to fail as well as to provide information for other analyses, such as statistical timing analysis.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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CITED BY 9
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Praveen Ghanta , Sarma Vrudhula , Sarvesh Bhardwaj , Rajendran Panda, Stochastic variational analysis of large power grids considering intra-die correlations, Proceedings of the 43rd annual conference on Design automation, July 24-28, 2006, San Francisco, CA, USA
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Ning Mi , Sheldon X.-D. Tan , Pu Liu , Jian Cui , Yici Cai , Xianlong Hong, Stochastic extended Krylov subspace method for variational analysis of on-chip power grid networks, Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design, November 05-08, 2007, San Jose, California
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