On Compacting Test Response Data Containing Unknown Values

ABSTRACT

The design of a test response compactor called a Block Compactoris given. Block Compactors belong to a new class of compactorscalled Finite Memory Compactors. Different from spacecompactors, finite memory compactors contain memory elements.Also unlike time compactors, finite memory compactors havefinite impulse response. These properties give finite memorycompactors the ability to achieve higher compaction ratios thanspace compactors and still be able to tolerate unknown values intest responses. The proposed Block Compactors, as an instance offinite memory compactors generate a signature of response data inseveral scan cycles. Results presented on several industrial designsshow that Block Compactors provide better test quality and higherdata compaction than earlier works on test response compactors.

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INDEX TERMS

Primary Classification:
  B. Hardware
  B.7 INTEGRATED CIRCUITS
      B.7.1 Types and Design Styles
          Subjects: Memory technologies

Additional Classification:
  B. Hardware
  B.3 MEMORY STRUCTURES
      B.3.2 Design Styles
          Subjects: Primary memory
  B.5 REGISTER-TRANSFER-LEVEL IMPLEMENTATION
      B.5.1 Design
          Subjects: Memory design

General Terms:
Algorithms, Design, Performance