| Protocol conformance test generation using multiple UIO sequences with overlapping |
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Applications, Technologies, Architectures, and Protocols for Computer Communication
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Proceedings of the ACM symposium on Communications architectures & protocols
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Philadelphia, Pennsylvania, United States
Pages: 118 - 125
Year of Publication: 1990
ISBN:0-89791-405-8
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Authors
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B. Yang
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Department of Computer Science, University of Ottawa, Ottawa, Ontario, Canada KlN 9B4
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H. Ural
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Department of Computer Science, University of Ottawa, Ottawa, Ontario, Canada KlN 9B4
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Downloads (6 Weeks): 7, Downloads (12 Months): 31, Citation Count: 12
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ABSTRACT
This paper describes an optimization method for reducing the length of protocol conformance test sequences by overlapping test subsequences obtained using UIO sequences. It is shown that test sequences generated by this method are substantially shorter than those generated by other methods employing UIO sequences.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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B. Yang and H. Ural, "On FSM-based optimum test sequence generation", To appear in: Proc. 2nd Int'l Conf. on Comm. Systems (ICCS'90), Nov. 1990.
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CITED BY 12
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Myungchul Kim , Sangjo Yoo , Jinhee Park , Sungwon Kang , Soon J. Hyun , Hyuckjae Lee, A dynamic protocol conformance test method, Journal of Systems and Software, v.67 n.1, p.31-43, 15 July 2003
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Robert M. Hierons , Kirill Bogdanov , Jonathan P. Bowen , Rance Cleaveland , John Derrick , Jeremy Dick , Marian Gheorghe , Mark Harman , Kalpesh Kapoor , Paul Krause , Gerald Lüttgen , Anthony J. H. Simons , Sergiy Vilkomir , Martin R. Woodward , Hussein Zedan, Using formal specifications to support testing, ACM Computing Surveys (CSUR), v.41 n.2, p.1-76, February 2009
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