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Using the stuck-at fault model: how well does it work?
Source ACM Southeast Regional Conference archive
Proceedings of the 28th annual Southeast regional conference table of contents
Pages: 40 - 46  
Year of Publication: 1990
ISBN:0-89791-356-6
Authors
A. A. Fennisi
D. S. Reeves
Sponsor
ACM: Association for Computing Machinery
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): n/a,   Downloads (12 Months): n/a,   Citation Count: 0
Additional Information:

index terms   collaborative colleagues  

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DOI Bookmark: Use this link to bookmark this Article: http://doi.acm.org/10.1145/98949.98968
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INDEX TERMS

Primary Classification:
  B. Hardware
  B.7 INTEGRATED CIRCUITS
      B.7.3 Reliability and Testing**
          Subjects: Test generation**

Additional Classification:
  B. Hardware
  B.7 INTEGRATED CIRCUITS


General Terms:
Design, Experimentation, Measurement, Performance

Collaborative Colleagues:
A. A. Fennisi: colleagues
D. S. Reeves: colleagues

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