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A noise optimization technique for codesign of CMOS radio-frequency low noise amplifiers and low-quality spiral inductors
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Source Great Lakes Symposium on VLSI archive
Proceedings of the 14th ACM Great Lakes symposium on VLSI table of contents
Boston, MA, USA
POSTER SESSION: Poster Session 1 table of contents
Pages: 178 - 182  
Year of Publication: 2004
ISBN:1-58113-853-9
Authors
Shaolei Quan  Michigan State University, East Lansing, Michigan
Chin-Long Wey  National Central University, Taoyuan, Taiwan, R.O.C.
Sponsors
ACM: Association for Computing Machinery
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
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ABSTRACT

Series resistance associated with inductor is usually ignored in noise optimization for CMOS low noise amplifiers (LNAs). With low-quality on-chip inductor the series resistance, however, degrades input matching and increases noise figure considerably. The LNA design is complicated by the fact that the series resistance varies with inductance in some specific pattern determined by physical implementation for on-chip inductor. This paper presents a novel noise optimization technique for the codesign of LNA and low-quality square spiral inductor. Theoretical derivation is given to model the tradeoff between thermal noise of series resistance and transistor channel noise for minimizing noise figure. A figure-of-merit (FOM) is proposed to characterize the relation between quality factor and effective inductance for square spiral inductor. The codesign of LNA and inductor is done by performing noise optimization for constant FOM. Design procedure is developed and validated by post-layout simulation in AMI 0.6um CMOS process with Cadence SpectreRF and Berkeley ASITIC tools.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
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Collaborative Colleagues:
Shaolei Quan: colleagues
Chin-Long Wey: colleagues