ACM Home Page
Please provide us with feedback. Feedback
A Bayesian approach to fault classification
Full text PdfPdf (877 KB)
Source Joint International Conference on Measurement and Modeling of Computer Systems archive
Proceedings of the 1990 ACM SIGMETRICS conference on Measurement and modeling of computer systems table of contents
Univ. of Colorado, Boulder, Colorado, United States
Pages: 58 - 66  
Year of Publication: 1990
ISBN:0-89791-359-0
Also published in ...
Authors
Tein-Hsiang Lin  Department of Electrical and Computer Engineering, State University of New York at Buffalo, Buffalo, New York
Kang G. Shin  Real-Time Computing Laboratory, Department of Electrical Engineering and Computer Science, The University of Michigan, Ann Arbor, Michigan
Sponsor
SIGMETRICS: ACM Special Interest Group on Measurement and Evaluation
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 14,   Downloads (12 Months): 41,   Citation Count: 2
Additional Information:

abstract   references   cited by   index terms   collaborative colleagues  

Tools and Actions: Request Permissions Request Permissions    Review this Article  
DOI Bookmark: Use this link to bookmark this Article: http://doi.acm.org/10.1145/98457.98505
What is a DOI?

ABSTRACT

According to their temporal behavior, faults in computer systems are classified into permanent, intermittent, and transient faults. Since it is impossible to identify the type of a fault upon its first detection, the common practice is to retry the failed instruction one or more times and then use other fault recovery methods, such as rollback or restart, if the retry is not successful. To determine an “optimal” (in some sense) number of retries, we need to know several fault parameters, which can be estimated only after classifying all the faults detected in the past. In this paper we propose a new fault classification scheme which assigns a fault type to each detected fault based on its detection time, the outcome of retry, and its detection symptom. This classification procedure utilizes the Bayesian decision theory to sequentially update the estimation of fault parameters whenever a detected fault is classified. An important advantage of this classification is the early identification of presence of an intermittent fault so that appropriate measures can be taken before it causes a serious damage to the system. To assess the goodness of the proposed scheme, the probability of incorrect classification is also analyzed and compared with simulation results.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
K. G. Shin and Y.-H. Lee, "Error detection process - model, design, and its impact on computer performance," IEEE Trans. Computers, vol. C-33, pp. 529- 540, June 1984.
 
2
J. C. Laprie, "Dependable computing and fault tolerance: Concepts and terminology," Digest of papers, FTCS-15, pp. 2-11, June 1985.
 
3
 
4
D. P. Siewiorek and R. S. Swarz, The Theory and Practice of Reliable System Design. Bedford, MA: Digital Equipment Corporation, 1982.
 
5
D. P. Siewiorek, V. Kini, H. Mashburn, S. R. McConnel, and M. M. Tsao, "A case study of c.mmp, cm*, and c.vmp: Part i -experiences with fault tolerance in nlultiprocessor systems," Proceedings of the IEEE, vol. 66, pp. 1178-1199, Oct. 1978.
 
6
O. Tasar and V. Tasar, "A study of intermittent fault in digital computers," Proc. Nat. Comput. Con}., pp. 807- 811, June 1977.
7
 
8
 
9
 
10
J. O. Berger, Statistical Decision Theory, Foundations, Concepts, Methods. New York: Springer-Verlag, 2nd ed., 1985.
 
11
M. H. DeGroot, Optimal Statistical Decisions. New York: McGraw-Hill Book Company, 1970.


Collaborative Colleagues:
Tein-Hsiang Lin: colleagues
Kang G. Shin: colleagues