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Multilevel routing with antenna avoidance
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Source International Symposium on Physical Design archive
Proceedings of the 2004 international symposium on Physical design table of contents
Phoenix, Arizona, USA
SESSION: Routing topology optimization table of contents
Pages: 34 - 40  
Year of Publication: 2004
ISBN:1-58113-817-2
Authors
Tsung-Yi Ho  National Taiwan University, Taipei, Taiwan
Yao-Wen Chang  National Taiwan University, Taipei, Taiwan
Sao-Jie Chen  National Taiwan University, Taipei, Taiwan
Sponsors
ACM: Association for Computing Machinery
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 5,   Downloads (12 Months): 40,   Citation Count: 11
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ABSTRACT

As technology advances into the nanometer territory, the antenna problem has caused significant impact on routing tools. The antenna effect is a phenomenon of plasma-induced gate oxide degradation caused by charge accumulation on conductors. It directly influences manufacturability and yield of VLSI circuits, especially in deep-submicron technology using high density plasma. Furthermore, the continuous increase of the problem size of IC routing is also a great challenge to existing routing algorithms. In this paper, we propose a novel framework for multilevel full-chip routing with antenna avoidance using a built-in jumper insertion approach. Experimental results show that our approach reduced antenna-violated gates by about 98% and also achieved 100% routing completion for all circuits.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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J. Cong and J. Shinnerl, Multilevel Optimization in VLSICAD, Kluwer Academic Publishers, 2003.
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H. Shirota, T. Sadakane, M. Terai, and K. Okazaki, "A new router for reducing "Antenna effect" in ASIC design", Proc. Custom Integrated Circuit Conference, pp. 27.5.1 -- 27.5.4, Sep. 1998.
 
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H. Watanabe, J. Komori, K. Higashitani, M. Sekine, and H. Koyama, "A wafer level monitoring method for plasma-charging damage using antenna PMOSFET test structure", IEEE Trans. on Semiconductor Manufacturing, pp. 228--232, May. 1997.

CITED BY  11

Collaborative Colleagues:
Tsung-Yi Ho: colleagues
Yao-Wen Chang: colleagues
Sao-Jie Chen: colleagues