| Optimal-time multipliers and C-testability |
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ACM Symposium on Parallel Algorithms and Architectures
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Proceedings of the second annual ACM symposium on Parallel algorithms and architectures
table of contents
Island of Crete, Greece
Pages: 146 - 154
Year of Publication: 1990
ISBN:0-89791-370-1
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Authors
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B. Becker
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Fachbereich 20 - Informatik, Johann Wolfgang Goethe-Universität, D-6000 Frankfurt/Main, West Germany
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J. Hartmann
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Lehrstuhl Prof. Hotz, Fachbereich 14 - Informatik, Universität des Saarlandes, D-6600 Saarbrücken, West Germany
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| Bibliometrics |
Downloads (6 Weeks): 3, Downloads (12 Months): 18, Citation Count: 2
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REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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BhHa
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B. Becker: 'An Easily Testable Optimal- Time VLSI-Multipller', Acta Informatlca 24, 1987, pp. 363-380
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B. Becker, U. Sparmann: 'A Uniform Test Approach for RCC-Adders', Proc. of the 3rd Aegean Workshop of Computing, 1988
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R.P. Brent, H.T. Kung: 'A Regular Layout for Parallel Adders', IEEE Trans. on Comp., Vol. C-31, 1~2, pp. 260-264
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A. Chatterjee, J.A. )~braham: 'Test Generation for Arithmetic Units by Graph Labelling', Proc. 1987 Int. Symp. Fault-Tolerant Computing, pp. 284-289
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FeSh
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J. Ferguson, J.P. Shen: 'The Design of Easily-Testable Array Multipliers', IEEE Trans. on Comp., Vol. C-33, 1984, pp. 554- 560
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H. Fujiwara: 'A New PLA Design for Universal Testability', IEEE Trans. on Comp., Vol. C-33, 1984, pp. 745-750
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J. Hartmann: 'Ein C-Test ffir einen schnellen Multiplizierer', T.R., 2/1988, SFB 124, Saarbrficken 1988
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Sung Je Hong" 'An Easily Testable Parallel Multiplier', Proc. 1988 Int. Symp. Fault- Tolerant Computing, pp. 214-219
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B. Becker , G. Hotz , R. Kolla , P. Molitor , H.-G. Osthof, Hierarchical design based on a calculus of nets, Proceedings of the 24th ACM/IEEE conference on Design automation, p.649-653, June 28-July 01, 1987, Miami Beach, Florida, United States
[doi> 10.1145/37888.37992]
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E. HSrbst, M.Nett, H. Schw~rtzel: 'VE- NUS: Entwuff yon VLSI-Schaltungen', Springer Verlag, 1986
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M. Robinson, J. Rajski: 'An Algorithmic Branch and Bound Method For PLA Test Pattern Generation', Proc. 1988 Int. Test Conf., pp. 784-795
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T. Sridhar, J.P. Hayes: 'Design of Easily Testable Bit-Sliced Systems', IEEE Trans. on Comp., Vol. C-30, 1981, pp. 324-336
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VuLu
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J. Vuillemin, W.K. Luk: 'Recursive Implementation of Optimal Time VLSI Integer Multipliers', IFIP Proc. VLSI'83, 1983, pp. 155-168
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C.S. Wallace: 'A Suggestion for a Fast Multiplier', IEEE Trans. on Electronic Computers, EC-13, 1964, pp. 14-17
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