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Flexibility measurement of domain-specific reconfigurable hardware
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Source International Symposium on Field Programmable Gate Arrays archive
Proceedings of the 2004 ACM/SIGDA 12th international symposium on Field programmable gate arrays table of contents
Monterey, California, USA
SESSION: Reconfigurable computing: analysis and trends table of contents
Pages: 155 - 161  
Year of Publication: 2004
ISBN:1-58113-829-6
Authors
Katherine Compton  University of Wisconsin-Madison, Madison, WI
Scott Hauck  University of Washington, Seattle, WA
Sponsors
SIGDA: ACM Special Interest Group on Design Automation
ACM: Association for Computing Machinery
Publisher
ACM  New York, NY, USA
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ABSTRACT

Traditional metrics used to compare hardware designs include area, performance, and power. However, these metrics do not form a complete evaluation of reconfigurable hardware. For these designs, flexibility is also a key issue, since it is the flexibility of reconfigurable hardware that allows it to implement a variety of circuits. Despite its importance, there is not yet an established method to measure flexibility. This paper explores the flexibility testing issue for domain-specific reconfigurable architectures. We discuss the concept of flexibility as it pertains to domain-specific architectures, and propose a flexibility testing technique involving synthetic circuit generation. This technique is then used to compare three different domain-specific architecture generation algorithms, demonstrating that the testing can in fact differentiate between architectures of differing levels of flexibility.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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M. Scott, "The RaPiD Cell Structure", Personal Communications, 2001.
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M. Hutton, J. Rose, J. Grossman, and D. Corneil, "Characterization and Parameterized Generation of Synthetic Combinational Benchmark Circuits", IEEE Transactions on CAD, Vol. 17, No. 10, pp. 985--996, October 1998.
 
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M. Hutton, J. Rose and D. Corneil, "Automatic Generation of Synthetic Sequential Benchmark Circuits", IEEE Transactions on CAD, Vol. 21, No. 8, pp. 928--940, August 2002.
 
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Collaborative Colleagues:
Katherine Compton: colleagues
Scott Hauck: colleagues