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Low-power FPGA using pre-defined dual-Vdd/dual-Vt fabrics
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Source International Symposium on Field Programmable Gate Arrays archive
Proceedings of the 2004 ACM/SIGDA 12th international symposium on Field programmable gate arrays table of contents
Monterey, California, USA
SESSION: Tools and architectures for power minimization table of contents
Pages: 42 - 50  
Year of Publication: 2004
ISBN:1-58113-829-6
Authors
Fei Li  University of California, Los Angeles, CA
Yan Lin  University of California, Los Angeles, CA
Lei He  University of California, Los Angeles, CA
Jason Cong  University of California, Los Angeles, CA
Sponsors
SIGDA: ACM Special Interest Group on Design Automation
ACM: Association for Computing Machinery
Publisher
ACM  New York, NY, USA
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Downloads (6 Weeks): 8,   Downloads (12 Months): 80,   Citation Count: 25
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ABSTRACT

Traditional FPGAs use uniform supply voltage Vdd and uniform threshold voltage Vt. We propose to use pre-defined dual-Vdd and dual-Vt fabrics to reduce FPGA power. We design FPGA circuits with dual-Vdd/dual-Vt to effectively reduce both dynamic power and leakage power, and define dual-Vdd/dual-Vt FPGA fabrics based on the profiling of benchmark circuits. We further develop CAD algorithms including power-sensitivity based voltage assignment and simulated-annealing based placement to leverage such fabrics. Compared to the conventional fabric using uniform Vdd/Vt at the same target clock frequency, our new fabric using dual Vt achieves 9% to 20% power reduction. However, the pre-defined FPGA fabric using both dual Vdd and dual Vt only achieves on average 2% extra power reduction. It is because that the pre-designed dual-Vdd layout pattern introduces non-negligible performance penalty. Therefore, programmability of supply voltage is needed to achieve significant power saving for dual-Vdd FPGAs. To our best knowledge, it is the first in-depth study on applying both dual-Vdd and dual-Vt to FPGA considering circuits, fabrics and CAD algorithms.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

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CITED BY  25