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ACM SIGGRAPH 2003 Sketches & Applications table of contents
San Diego, California
SESSION: BRDF table of contents
Pages: 1 - 1  
Year of Publication: 2003
Authors
Jochen Lang  MPI Informatik, Saarbrücken, Germany
Hans-Peter Seidel  MPI Informatik, Saarbrücken, Germany
Hendrik P. A. Lensch  MPI Informatik, Saarbrücken, Germany
Sponsor
SIGGRAPH: ACM Special Interest Group on Computer Graphics and Interactive Techniques
Publisher
ACM  New York, NY, USA
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Downloads (6 Weeks): 4,   Downloads (12 Months): 15,   Citation Count: 1
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ABSTRACT

The estimation of the bi-directional reflectance distribution function (BRDF) of a 3D object requires reflectance measurements under numerous viewing and lighting directions. This sketch summarizes our method to select advantageous directions. Uncertainty minimization of the estimated BRDF parameters forms the theoretical underpinning of our acquisition planner. Our hardware-accelerated planner can aid manual and automatic measurement, reduces measurement effort and increases the quality of the acquired models.



Collaborative Colleagues:
Jochen Lang: colleagues
Hans-Peter Seidel: colleagues
Hendrik P. A. Lensch: colleagues