| A Systematic Methodology to Compute the Architectural Vulnerability Factors for a High-Performance Microprocessor |
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International Symposium on Microarchitecture
archive
Proceedings of the 36th annual IEEE/ACM International Symposium on Microarchitecture
table of contents
Page: 29
Year of Publication: 2003
ISBN:0-7695-2043-X
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Authors
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Shubhendu S. Mukherjee
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VSSAD,MMDC,Intel Corporation, 334 South Street.Shrewsbury,Massachusetts, Advanced Computer Architecture Lab, EECS Department,University of Michigan, 1301 Beal Avenue,Ann Arbor,MI
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Christopher Weaver
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VSSAD,MMDC,Intel Corporation, 334 South Street.Shrewsbury,Massachusetts, Advanced Computer Architecture Lab, EECS Department,University of Michigan, 1301 Beal Avenue,Ann Arbor,MI
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Joel Emer
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VSSAD,MMDC,Intel Corporation, 334 South Street.Shrewsbury,Massachusetts, Advanced Computer Architecture Lab, EECS Department,University of Michigan, 1301 Beal Avenue,Ann Arbor,MI
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Steven K. Reinhardt
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VSSAD,MMDC,Intel Corporation, 334 South Street.Shrewsbury,Massachusetts, Advanced Computer Architecture Lab, EECS Department,University of Michigan, 1301 Beal Avenue,Ann Arbor,MI
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Todd Austin
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Advanced Computer Architecture Lab, EECS Department,University of Michigan, 1301 Beal Avenue,Ann Arbor,MI
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IEEE Computer Society
Washington, DC, USA
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| Bibliometrics |
Downloads (6 Weeks): 15, Downloads (12 Months): 105, Citation Count: 55
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ABSTRACT
Single-event upsets from particle strikes have become akey challenge in microprocessor design. Techniques todeal with these transient faults exist, but come at a cost.Designers clearly require accurate estimates of processorerror rates to make appropriate cost/reliability trade-offs.This paper describes a method for generating theseestimates.A key aspect of this analysis is that some single-bit faults(such as those occurring in the branch predictor) will notproduce an error in a program's output. We define astructure's architectural vulnerability factor (AVF) as theprobability that a fault in that particular structure willresult in an error. A structure's error rate is the product ofits raw error rate, as determined by process and circuittechnology, and the AVF.Unfortunately, computing AVFs of complex structures,such as the instruction queue, can be quite involved. Weidentify numerous cases, such as prefetches, dynamicallydead code, and wrong-path instructions, in which a faultwill not affect correct execution. We instrument a detailedIA64 processor simulator to map bit-level microarchitecturalstate to these cases, generating per-structure AVFestimates. This analysis shows AVFs of 28% and 9% forthe instruction queue and execution units, respectively,averaged across dynamic sections of the entire CPU2000benchmark suite.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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Subhasish Mitra , Tanay Karnik , Norbert Seifert , Ming Zhang, Logic soft errors in sub-65nm technologies design and CAD challenges, Proceedings of the 42nd annual conference on Design automation, June 13-17, 2005, San Diego, California, USA
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George A. Reis , Jonathan Chang , Neil Vachharajani , Ram Rangan , David I. August , Shubhendu S. Mukherjee, Software-controlled fault tolerance, ACM Transactions on Architecture and Code Optimization (TACO), v.2 n.4, p.366-396, December 2005
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Jared C. Smolens , Jangwoo Kim , James C. Hoe , Babak Falsafi, Efficient Resource Sharing in Concurrent Error Detecting Superscalar Microarchitectures, Proceedings of the 37th annual IEEE/ACM International Symposium on Microarchitecture, p.257-268, December 04-08, 2004, Portland, Oregon
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Jason A. Blome , Shantanu Gupta , Shuguang Feng , Scott Mahlke, Cost-efficient soft error protection for embedded microprocessors, Proceedings of the 2006 international conference on Compilers, architecture and synthesis for embedded systems, October 22-25, 2006, Seoul, Korea
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Vladimir Stojanovic , R. Iris Bahar , Jennifer Dworak , Richard Weiss, A cost-effective implementation of an ECC-protected instruction queue for out-of-order microprocessors, Proceedings of the 43rd annual conference on Design automation, July 24-28, 2006, San Francisco, CA, USA
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Hossein Asadi , Vilas Sridharan , Mehdi B. Tahoori , David Kaeli, Vulnerability analysis of L2 cache elements to single event upsets, Proceedings of the conference on Design, automation and test in Europe: Proceedings, March 06-10, 2006, Munich, Germany
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Steven Swanson , Andrew Schwerin , Martha Mercaldi , Andrew Petersen , Andrew Putnam , Ken Michelson , Mark Oskin , Susan J. Eggers, The WaveScalar architecture, ACM Transactions on Computer Systems (TOCS), v.25 n.2, p.4-es, May 2007
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Kypros Constantinides , Stephen Plaza , Jason Blome , Valeria Bertacco , Scott Mahlke , Todd Austin , Bin Zhang , Michael Orshansky, Architecting a reliable CMP switch architecture, ACM Transactions on Architecture and Code Optimization (TACO), v.4 n.1, p.2-es, March 2007
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George A. Reis , Jonathan Chang , Neil Vachharajani , Ram Rangan , David I. August , Shubhendu S. Mukherjee, Design and Evaluation of Hybrid Fault-Detection Systems, ACM SIGARCH Computer Architecture News, v.33 n.2, p.148-159, May 2005
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Arijit Biswas , Paul Racunas , Razvan Cheveresan , Joel Emer , Shubhendu S. Mukherjee , Ram Rangan, Computing Architectural Vulnerability Factors for Address-Based Structures, ACM SIGARCH Computer Architecture News, v.33 n.2, p.532-543, May 2005
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Ramtilak Vemu , Abhijit Jas , Jacob A. Abraham , Rajesh Galivanche , Srinivas Patil, A low-cost concurrent error detection technique for processor control logic, Proceedings of the conference on Design, automation and test in Europe, March 10-14, 2008, Munich, Germany
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P. N. Sanda , J. W. Kellington , P. Kudva , R. Kalla , R. B. McBeth , J. Ackaret , R. Lockwood , J. Schumann , C. R. Jones, Soft-error resilience of the IBM POWER6 processor, IBM Journal of Research and Development, v.52 n.3, p.275-284, May 2008
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J. A. Rivers , P. Bose , P. Kudva , J.-D. Wellman , P. N. Sanda , E. H. Cannon , L. C. Alves, Phaser: phased methodology for modeling the system-level effects of soft errors, IBM Journal of Research and Development, v.52 n.3, p.293-306, May 2008
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Jie Hu , Feihui Li , Vijay Degalahal , Mahmut Kandemir , N. Vijaykrishnan , Mary J. Irwin, Compiler-assisted soft error detection under performance and energy constraints in embedded systems, ACM Transactions on Embedded Computing Systems (TECS), v.8 n.4, p.1-30, July 2009
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