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A Systematic Methodology to Compute the Architectural Vulnerability Factors for a High-Performance Microprocessor
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Source International Symposium on Microarchitecture archive
Proceedings of the 36th annual IEEE/ACM International Symposium on Microarchitecture table of contents
Page: 29  
Year of Publication: 2003
ISBN:0-7695-2043-X
Authors
Shubhendu S. Mukherjee  VSSAD,MMDC,Intel Corporation, 334 South Street.Shrewsbury,Massachusetts, Advanced Computer Architecture Lab, EECS Department,University of Michigan, 1301 Beal Avenue,Ann Arbor,MI
Christopher Weaver  VSSAD,MMDC,Intel Corporation, 334 South Street.Shrewsbury,Massachusetts, Advanced Computer Architecture Lab, EECS Department,University of Michigan, 1301 Beal Avenue,Ann Arbor,MI
Joel Emer  VSSAD,MMDC,Intel Corporation, 334 South Street.Shrewsbury,Massachusetts, Advanced Computer Architecture Lab, EECS Department,University of Michigan, 1301 Beal Avenue,Ann Arbor,MI
Steven K. Reinhardt  VSSAD,MMDC,Intel Corporation, 334 South Street.Shrewsbury,Massachusetts, Advanced Computer Architecture Lab, EECS Department,University of Michigan, 1301 Beal Avenue,Ann Arbor,MI
Todd Austin  Advanced Computer Architecture Lab, EECS Department,University of Michigan, 1301 Beal Avenue,Ann Arbor,MI
Sponsor
SIGMICRO: ACM Special Interest Group on Microarchitectural Research and Processing
Publisher
IEEE Computer Society  Washington, DC, USA
Bibliometrics
Downloads (6 Weeks): 15,   Downloads (12 Months): 105,   Citation Count: 55
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ABSTRACT

Single-event upsets from particle strikes have become akey challenge in microprocessor design. Techniques todeal with these transient faults exist, but come at a cost.Designers clearly require accurate estimates of processorerror rates to make appropriate cost/reliability trade-offs.This paper describes a method for generating theseestimates.A key aspect of this analysis is that some single-bit faults(such as those occurring in the branch predictor) will notproduce an error in a program's output. We define astructure's architectural vulnerability factor (AVF) as theprobability that a fault in that particular structure willresult in an error. A structure's error rate is the product ofits raw error rate, as determined by process and circuittechnology, and the AVF.Unfortunately, computing AVFs of complex structures,such as the instruction queue, can be quite involved. Weidentify numerous cases, such as prefetches, dynamicallydead code, and wrong-path instructions, in which a faultwill not affect correct execution. We instrument a detailedIA64 processor simulator to map bit-level microarchitecturalstate to these cases, generating per-structure AVFestimates. This analysis shows AVFs of 28% and 9% forthe instruction queue and execution units, respectively,averaged across dynamic sections of the entire CPU2000benchmark suite.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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[25] Nicholas Wang and Sanjay Patel, "Modeling the Effect of Transient Errors on High Performance Microprocessors," Center for Circuits, Systems, and Software (C2S2), 2nd Annual Review, Berkeley, March 18-19, 2003.
 
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[26] Alan Wood, "Data Integrity Concepts, Features, and Technology," White paper, Tandem Division, Compaq Computer Corporation.
 
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CITED BY  55

Collaborative Colleagues:
Shubhendu S. Mukherjee: colleagues
Christopher Weaver: colleagues
Joel Emer: colleagues
Steven K. Reinhardt: colleagues
Todd Austin: colleagues