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Measuring bidirectional texture reflectance with a kaleidoscope
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Source ACM Transactions on Graphics (TOG) archive
Volume 22 ,  Issue 3  (July 2003) table of contents
Proceedings of ACM SIGGRAPH 2003
SESSION: Scattering and reflectance measurement table of contents
Pages: 741 - 748  
Year of Publication: 2003
ISSN:0730-0301
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Authors
Jefferson Y. Han  New York University
Ken Perlin  New York University
Publisher
ACM  New York, NY, USA
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Downloads (6 Weeks): 26,   Downloads (12 Months): 160,   Citation Count: 15
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ABSTRACT

We describe a new technique for measuring the bidirectional texture function (BTF) of a surface that requires no mechanical movement, can measure surfaces in situ under arbitrary lighting conditions, and can be made small, portable and inexpensive. The enabling innovation is the use of a tapered kaleidoscope, which allows a camera to view the same surface sample simultaneously from many directions. Similarly, the surface can be simultaneously illuminated from many directions, using only a single structured light source. We describe the techniques of construction and measurement, and we show experimental results.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

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CITED BY  15

Collaborative Colleagues:
Jefferson Y. Han: colleagues
Ken Perlin: colleagues