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ABSTRACT
Basic goals for logic and fault simulation are accuracy, execution speed, and modeling ease. Accuracy means that adequate state and timing detail must be maintained, and that good and faulted networks must be simulated with equal accuracy. High speed simulation is desirable to perform massive fault simulations of large networks, and modeling ease is desirable to build models easily and quickly. It should be observed that some of the above goals are in mutual conflict. For example, modeling ease and high execution speed are normally only achievable by a sacrifice in accuracy, and high accuracy is only possible by more elaborate modeling efforts or slower execution speeds, or both. As a consequence it becomes important to achieve a balance between these goals. The balance achieved here, in part dictated by the demands of fault simulation, emphasizes execution speed, adequate accuracy, and a simple modeling method. A new logic and fault simulator, VOTE (Verification of Test Effectiveness) is described. The specifics to be described here fall into two categories: those which are of general interest, and those which are strictly implementation items.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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CITED BY 13
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Michel Heydemann , Alain Plaignaud , Daniel Dure, The architecture of a highly integrated simulation system, Proceedings of the 25th ACM/IEEE conference on Design automation, p.617-621, June 12-15, 1988, Atlantic City, New Jersey, United States
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Susumu Goshima , Yuichi Oka , Tokinori Kozawa , Teruo Mori , Yoshimitsu Takeguchi , Yasuhiro Ohno, Diagnostic system for large scale logic cards and LSI'S., Proceedings of the 18th conference on Design automation, p.256-259, June 29-July 01, 1981, Nashville, Tennessee, United States
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Fredrick J. Hill , Eltayeb Abuelyamen , Wei-Kang Huang , Guo-Qiang Shen, A new two task algorithm for clock mode fault simulation in sequential circuits, Proceedings of the 25th ACM/IEEE conference on Design automation, p.583-586, June 12-15, 1988, Atlantic City, New Jersey, United States
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