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High-speed concurrent fault simulation with vectors and scalars
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Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 17th Design Automation Conference table of contents
Minneapolis, Minnesota, United States
Pages: 374 - 380  
Year of Publication: 1980
ISBN:0-89791-020-6
Authors
Sponsors
IEEE-CS\DATC : IEEE Computer Society
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
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Downloads (6 Weeks): 0,   Downloads (12 Months): 2,   Citation Count: 13
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ABSTRACT

Basic goals for logic and fault simulation are accuracy, execution speed, and modeling ease. Accuracy means that adequate state and timing detail must be maintained, and that good and faulted networks must be simulated with equal accuracy. High speed simulation is desirable to perform massive fault simulations of large networks, and modeling ease is desirable to build models easily and quickly. It should be observed that some of the above goals are in mutual conflict. For example, modeling ease and high execution speed are normally only achievable by a sacrifice in accuracy, and high accuracy is only possible by more elaborate modeling efforts or slower execution speeds, or both. As a consequence it becomes important to achieve a balance between these goals. The balance achieved here, in part dictated by the demands of fault simulation, emphasizes execution speed, adequate accuracy, and a simple modeling method. A new logic and fault simulator, VOTE (Verification of Test Effectiveness) is described. The specifics to be described here fall into two categories: those which are of general interest, and those which are strictly implementation items.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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M. Breuer and A. Friedman, "Diagnosis & Reliable Design of Digital Systems", Computer Science Press, (1976).
 
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P.L. Flake, G. Musgrave, and I.J. White, "A Digital Systems Systems Simulator - HILO", Digital Processes, 1 (1975).
 
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N. Phillips and J. Tellier, "Efficient Event Manipulation - The Key to Large Scale Simulation", Semiconductor Test Conference Proceedings (October 1978).
 
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D.M. Schuler et al, "A Computer Program for Logic Simulation, Fault Simulation, and the Generation of Tests for Digital Circuits", Simulation of Systems, North-Holland Publishing Co., pp. 453-459 (1976).
 
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D.M. Schuler et al, "A Program for the Simulation and Concurrent Fault Simulation of Digital Circuits Described with Gate and Functional Models", Test Conference Proceedings, pp. 203-207 (1979).
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CITED BY  13

Collaborative Colleagues:
E. Ulrich: colleagues
D. Lacy: colleagues
N. Phillips: colleagues
J. Tellier: colleagues
M. Kearney: colleagues
T. Elkind: colleagues
R. Beaven: colleagues