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SCOAP: Sandia controllability/observability analysis program

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Annual ACM IEEE Design Automation Conference archive
Proceedings of the 17th Design Automation Conference table of contents

Minneapolis, Minnesota, United States

Pages: 190 - 196

Year of Publication: 1980

ISBN:0-89791-020-6

Authors

Lawrence H. Goldstein
Evelyn L. Thigpen

Sponsors

IEEE-CS\DATC : IEEE Computer Society
SIGDA: ACM Special Interest Group on Design Automation

Publisher

ACM New York, NY, USA

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Downloads (6 Weeks): 4, Downloads (12 Months): 16, Citation Count: 36

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ABSTRACT

SCOAP is a program developed at Sandia National Laboratories for the analysis of digital circuit testability. Testability is related to the difficulty of controlling and observing the logical values of internal nodes from circuit inputs and outputs, respectively. This paper reviews the testability analysis algorithms and describes their implementation in the SCOAP program.

REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

	1	L. H. Goldstein, "Controllability/Observability Analysis of Digital Circuits,&rdquo CANDE Workshop, Mt. Hood, Oregon (1978).
	2	L. H. Goldstein, "Controllability/Observability Analysis of Digital Circuits," IEEE Trans. Circuits and Systems, Vol. 26, No. 9, (1979).
	3	L. H. Goldstein, "Controllability/Observability Analysis of Separable Logic Structures," Design for Testability Workshop, Boulder, Colorado (1979).
	4	E. B. Eichelberger , T. W. Williams, A logic design structure for LSI testability, Proceedings of the 14th conference on Design automation, p.462-468, January 1977
	5	W. Keiner and R. West, "Testability Measures," AUTOTESTCON, pp 49-55 (1977).
	6	W. J. Dejka, "Measure of Testability in Device and System Design," "Proc. 20th Midwest Symposium on Circuits and Systems," pp 39-52 (1977).
	7	J. E. Stephenson and J. Grason, "A Testability Measure for Register Transfer Level Digital Circuits," Proc. 6th Fault-Tolerant Computing Symposium, pp 101-107 (1976).
	8	John Grason, TMEAS, a testability measurement program, Proceedings of the 16th Conference on Design automation, p.156-161, June 25-27, 1979, San Diego, CA, United States
	9	Breuer and Associates, TEST/80—An Advanced ATG System for Digital Circuits, Report 1-77.
	10	P. G. Kovijanic, "Testability Analysis," 1979 Semiconductor Test Conference, October 1979.
	11	J. A. Dussault, "A Testability Measure," Proc. 1978 Semiconductor Test Conference, pp 113-116 (1978).
	12	H. Y. Chang and G. H. Heimbigner, "LAMP: Controllability, Observability, and Maintenance Engineering Technique (COMET)," Bell System Tech. J., Vol. 53, No. 8, pp 1505-1534 (1974).
	13	F. Barsi, F. Grandoni and P. Maestrini, "A Theory of Diagnosability of Digital Systems," IEEE Trans. Comput., Vol. C-25, pp 585-593 (1976).

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