Simple metrics for slew rate of RC circuits based on two circuit moments

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Simple metrics for slew rate of RC circuits based on two circuit moments

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Annual ACM IEEE Design Automation Conference archive
Proceedings of the 40th annual Design Automation Conference table of contents

Anaheim, CA, USA

SESSION: Interconnect noise avoidance methodologies & slew rate prediction table of contents

Pages: 950 - 953

Year of Publication: 2003

ISBN:1-58113-688-9

Authors

Kanak Agarwal	University of Michigan, Ann Arbor, MI
Dennis Sylvester	University of Michigan, Ann Arbor, MI
David Blaauw	University of Michigan, Ann Arbor, MI

Sponsor

ACM: Association for Computing Machinery

Publisher

ACM New York, NY, USA

Bibliometrics

Downloads (6 Weeks): 4, Downloads (12 Months): 24, Citation Count: 9

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ABSTRACT

In this paper we introduce simple metrics for the slew rate of an RC circuit based on the first two circuit moments. We develop two new slew metrics, S2M (slew with 2 moments) and scaled S2M, that provide high accuracy with the advantage of simple closed form expressions. S2M is very accurate for middle and far end nodes but it does not perform as well for near end nodes. Scaled S2M is developed to improve upon S2M for near end nodes and is shown to be highly accurate for near as well as far end nodes. For a large set of nets from an industrial 0.18 μm microprocessor, S2M matches SPICE within 2% on average with 78% of the sinks having less than 1% error. For the same test cases, the average error for scaled S2M is less than 3% with 99.4% of the nodes showing less than 5% error.

REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

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CITED BY 9

	Kanak Agarwal , Dennis Sylvester , David Blaauw , Frank Liu , Sani Nassif , Sarma Vrudhula, Variational delay metrics for interconnect timing analysis, Proceedings of the 41st annual conference on Design automation, June 07-11, 2004, San Diego, CA, USA
	Soroush Abbaspour , Hanif Fatemi , Massoud Pedram, VITA: variation-aware interconnect timing analysis for symmetric and skewed sources of variation considering variational ramp input, Proceedings of the 15th ACM Great Lakes symposium on VLSI, April 17-19, 2005, Chicago, Illinois, USA
	Chirayu S. Amin , Yehea I. Ismail , Florentin Dartu, Piece-wise approximations of RLCK circuit responses using moment matching, Proceedings of the 42nd annual conference on Design automation, June 13-17, 2005, San Diego, California, USA
	Mridul Agarwal , Kanak Agarwal , Dennis Sylvester , David Blaauw, Statistical modeling of cross-coupling effects in VLSI interconnects, Proceedings of the 2005 conference on Asia South Pacific design automation, January 18-21, 2005, Shanghai, China
	S. Engels , R. Wilson , N. Azémard , Philippe Maurine, A comprehensive performance macro-modeling of on-chip RC interconnects considering line shielding effects, Integration, the VLSI Journal, v.39 n.4, p.433-456, July 2006
	Xiaoji Ye , Peng Li , Frank Liu, Practical variation-aware interconnect delay and slew analysis for statistical timing verification, Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design, November 05-09, 2006, San Jose, California
	Y. I. Ismail , C. S. Amin, Computation of signal threshold crossing times directly from higher order moments, Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design, p.246-253, November 07-11, 2004
	Xiaoji Ye , Frank Liu , Peng Li, Fast variational interconnect delay and slew computation using quadratic models, IEEE Transactions on Very Large Scale Integration (VLSI) Systems, v.15 n.8, p.913-926, August 2007
	Peng Sun , Rong Luo, Closed-form solution for timing analysis of process variations on SWCNT interconnect, Proceedings of the 11th international workshop on System level interconnect prediction, July 26-27, 2009, San Francisco, CA, USA