| Learning from BDDs in SAT-based bounded model checking |
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Annual ACM IEEE Design Automation Conference
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Proceedings of the 40th annual Design Automation Conference
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Anaheim, CA, USA
SESSION: Advances in SAT
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Pages: 824 - 829
Year of Publication: 2003
ISBN:1-58113-688-9
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Authors
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Aarti Gupta
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NEC Labs America, Princeton, NJ
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Malay Ganai
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NEC Labs America, Princeton, NJ
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Chao Wang
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University of Colorado, Boulder, CO
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Zijiang Yang
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NEC Labs America, Princeton, NJ
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Pranav Ashar
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NEC Labs America, Princeton, NJ
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Downloads (6 Weeks): 8, Downloads (12 Months): 22, Citation Count: 6
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ABSTRACT
Bounded Model Checking (BMC) based on Boolean Satisfiability (SAT) procedures has recently gained popularity as an alternative to BDD-based model checking techniques for finding bugs in large designs. In this paper, we explore the use of learning from BDDs, where learned clauses generated by BDD-based analysis are added to the SAT solver, to supplement its other learning mechanisms. We propose several heuristics for guiding this process, aimed at increasing the usefulness of the learned clauses, while reducing the overheads. We demonstrate the effectiveness of our approach on several industrial designs, where BMC performance is improved and the design can be searched up to a greater depth by use of BDD-based learning.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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CITED BY 6
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Chao Wang , HoonSang Jin , Gary D. Hachtel , Fabio Somenzi, Refining the SAT decision ordering for bounded model checking, Proceedings of the 41st annual conference on Design automation, June 07-11, 2004, San Diego, CA, USA
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Sean Safarpour , Görschwin Fey , Andreas Veneris , Rolf Drechsler, Utilizing don't care states in SAT-based bounded sequential problems, Proceedings of the 15th ACM Great Lakes symposium on VLSI, April 17-19, 2005, Chicago, Illinois, USA
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Michael S. Hsiao , Shuo Sheng , Rajat Arora , Ankur Jain , Vamsi Boppana, Verification of large scale nano systems with unreliable nano devices, Nano, quantum and molecular computing: implications to high level design and validation, Kluwer Academic Publishers, Norwell, MA, 2004
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