| NORM: compact model order reduction of weakly nonlinear systems |
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Annual ACM IEEE Design Automation Conference
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Proceedings of the 40th annual Design Automation Conference
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Anaheim, CA, USA
SESSION: Nonlinear model order reduction
table of contents
Pages: 472 - 477
Year of Publication: 2003
ISBN:1-58113-688-9
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Authors
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Peng Li
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Carnegie Mellon University, Pittsburgh, Pennsylvania, USA
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Lawrence T. Pileggi
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Carnegie Mellon University, Pittsburgh, Pennsylvania, USA
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Downloads (6 Weeks): 3, Downloads (12 Months): 20, Citation Count: 15
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ABSTRACT
This paper presents a compact Nonlinear model Order Reduction Method (NORM) that is applicable for time-invariant and time-varying weakly nonlinear systems. NORM is suitable for reducing a class of weakly nonlinear systems that can be well characterized by low order Volterra functional series. Unlike existing projection based reduction methods [6]-[8], NORM begins with the general matrix-form Volterra nonlinear transfer functions to derive a set of minimum Krylov subspaces for order reduction. Direct moment matching of the nonlinear transfer functions by projection of the original system onto this set of minimum Krylov subspaces leads to a significant reduction of model size. As we will demonstrate as part of our comparison with existing methods, the efficacy of model order for weakly nonlinear systems is determined by the extend to which models can be reduced. Our results further indicate that a multiple-point version of NORM can substantially reduce the model size and approach the ultimate model compactness that is achievable for nonlinear system reduction. We demonstrate the practical utility of NORM for macro-modeling weakly nonlinear RF circuits with time-varying behavior.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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CITED BY 15
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Peng Li , Frank Liu , Xin Li , Lawrence T. Pileggi , Sani R. Nassif, Modeling Interconnect Variability Using Efficient Parametric Model Order Reduction, Proceedings of the conference on Design, Automation and Test in Europe, p.958-963, March 07-11, 2005
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