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Blade and razor: cell and interconnect delay analysis using current-based models
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Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 40th annual Design Automation Conference table of contents
Anaheim, CA, USA
SESSION: Delay and noise modeling in the nanometer regime table of contents
Pages: 386 - 389  
Year of Publication: 2003
ISBN:1-58113-688-9
Authors
John F. Croix  Silicon Metrics Corporation, Austin, TX
D. F. Wong  University of Illinois at Urbana-Champaign, Urbana, IL
Sponsor
ACM: Association for Computing Machinery
Publisher
ACM  New York, NY, USA
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Downloads (6 Weeks): 8,   Downloads (12 Months): 43,   Citation Count: 25
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ABSTRACT

In order to adequately account for nanometer effects during timing analysis, archaic standard cell models must be replaced. Simplifying assumptions used during characterization, such as nearly linear voltage inputs or lumped-capacitance loads, are no longer valid. Signal integrity analysis further complicates the characterization process because the typical voltage waveform used during characterization does not contain a noise component. This paper introduces two new technologies for standard cell and interconnect timing analysis: Blade and Razor. Blade is a novel cell model and runtime engine based on current flow. Razor is the accompanying interconnect model. Both Blade and Razor produce and consume arbitrary voltage waveforms with near-SPICE accuracy at speeds tens of thousands of times faster than SPICE.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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CITED BY  25

Collaborative Colleagues:
John F. Croix: colleagues
D. F. Wong: colleagues