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ABSTRACT
In order to adequately account for nanometer effects during timing analysis, archaic standard cell models must be replaced. Simplifying assumptions used during characterization, such as nearly linear voltage inputs or lumped-capacitance loads, are no longer valid. Signal integrity analysis further complicates the characterization process because the typical voltage waveform used during characterization does not contain a noise component. This paper introduces two new technologies for standard cell and interconnect timing analysis: Blade and Razor. Blade is a novel cell model and runtime engine based on current flow. Razor is the accompanying interconnect model. Both Blade and Razor produce and consume arbitrary voltage waveforms with near-SPICE accuracy at speeds tens of thousands of times faster than SPICE.
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Haihua Su , David Widiger , Chandramouli Kashyap , Frank Liu , Byron Krauter, A noise-driven effective capacitance method with fast embedded noise rule calculation for functional noise analysis, Proceedings of the 42nd annual conference on Design automation, June 13-17, 2005, San Diego, California, USA
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Chirayu Amin , Chandramouli Kashyap , Noel Menezes , Kip Killpack , Eli Chiprout, A multi-port current source model for multiple-input switching effects in CMOS library cells, Proceedings of the 43rd annual conference on Design automation, July 24-28, 2006, San Francisco, CA, USA
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Alex Mitev , Dinesh Ganesan , Dheepan Shanmugasundaram , Yu Cao , Janet M. Wang, A robust finite-point based gate model considering process variations, Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design, November 05-08, 2007, San Jose, California
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Anand Ramalingam , Ashish Kumar Singh , Sani R. Nassif , Michael Orshansky , David Z. Pan, Accurate waveform modeling using singular value decomposition with applications to timing analysis, Proceedings of the 44th annual conference on Design automation, June 04-08, 2007, San Diego, California
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Ravikishore Gandikota , Kaviraj Chopra , David Blaauw , Dennis Sylvester , Murat Becer, Top-k aggressors sets in delay noise analysis, Proceedings of the 44th annual conference on Design automation, June 04-08, 2007, San Diego, California
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S. Raja , F. Varadi , M. Becer , J. Geada, Transistor level gate modeling for accurate and fast timing, noise, and power analysis, Proceedings of the 45th annual conference on Design automation, June 08-13, 2008, Anaheim, California
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V. Zolotov , J. Xiong , S. Abbaspour , D. J. Hathaway , C. Visweswariah, Compact modeling of variational waveforms, Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design, November 05-08, 2007, San Jose, California
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Noel Menezes , Chandramouli Kashyap , Chirayu Amin, A "true" electrical cell model for timing, noise, and power grid verification, Proceedings of the 45th annual conference on Design automation, June 08-13, 2008, Anaheim, California
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Behnam Amelifard , Safar Hatami , Hanif Fatemi , Massoud Pedram, A current source model for CMOS logic cells considering multiple input switching and stack effect, Proceedings of the conference on Design, automation and test in Europe, March 10-14, 2008, Munich, Germany
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