| Delay and slew metrics using the lognormal distribution |
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Annual ACM IEEE Design Automation Conference
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Proceedings of the 40th annual Design Automation Conference
table of contents
Anaheim, CA, USA
SESSION: Delay and noise modeling in the nanometer regime
table of contents
Pages: 382 - 385
Year of Publication: 2003
ISBN:1-58113-688-9
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Downloads (6 Weeks): 4, Downloads (12 Months): 22, Citation Count: 8
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ABSTRACT
For optimizations like physical synthesis and static timing analysis, efficient interconnect delay and slew computation is critical. Since one cannot often afford to run AWE[12], constant time solutions are required. This work presents the first complete solution to closed form formulae for both delay and slew. Our metrics are derived from matching circuit moments to the lognormal distribution. From a single table, one can easily implement the metrics for delay and slew for both step and ramp inputs. Experiments validate the effectiveness of the metrics for nets from a real industrial design.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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[doi> 10.1145/288548.288555]
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Bogdan Tutuianu , Florentin Dartu , Lawrence Pileggi, An explicit RC-circuit delay approximation based on the first three moments of the impulse response, Proceedings of the 33rd annual conference on Design automation, p.611-616, June 03-07, 1996, Las Vegas, Nevada, United States
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