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ABSTRACT
Sleep transistors are effective to reduce dynamic and leakage power. The cluster-based design was proposed to reduce the sleep transistor area by clustering gates to minimize the simultaneous switching current per cluster and then inserting a sleep transistor per cluster. In the paper, we propose a novel distributed sleep transistor network (DSTN), and show that DSTN is intrinsically better than the cluster-based design in terms of the sleep transistor area and circuit performance. We reveal properties of optimal DSTN designs, and then develop an efficient algorithm for gate level DSTN synthesis. The algorithm obtains DSTN designs with up to 70.7% sleep transistor area reduction compared to cluster-based designs. Furthermore, we present custom layout designs to verify the area reduction by DSTN.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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CITED BY 21
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Pietro Babighian , Luca Benini , Alberto Macii , Enrico Macii, Post-layout leakage power minimization based on distributed sleep transistor insertion, Proceedings of the 2004 international symposium on Low power electronics and design, August 09-11, 2004, Newport Beach, California, USA
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De-Shiuan Chiou , Shih-Hsin Chen , Shih-Chieh Chang , Chingwei Yeh, Timing driven power gating, Proceedings of the 43rd annual conference on Design automation, July 24-28, 2006, San Francisco, CA, USA
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Yu Wang , Yongpan Liu , Rong Luo , Huazhong Yang , Hui Wang, Two-phase fine-grain sleep transistor insertion technique in leakage critical circuits, Proceedings of the 2006 international symposium on Low power electronics and design, October 04-06, 2006, Tegernsee, Bavaria, Germany
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Pietro Babighian , Luca Benini , Alberto Macii , Enrico Macii, Enabling fine-grain leakage management by voltage anchor insertion, Proceedings of the conference on Design, automation and test in Europe: Proceedings, March 06-10, 2006, Munich, Germany
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