|
ABSTRACT
In this survey, we outline basic SAT- and ATPG- procedures as well as their applications in formal hardware verification. We attempt to give the reader a trace trough literature and provide a basic orientation concerning the problem formulations and known approaches in this active field of research.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
| |
1
|
{AB90} M. Abramovici, M. Breuer, and A. Friedman, Digital Systems Testing and Testable Design. Computer Science Press, New York, 1990.
|
| |
2
|
{AS01} F. A. Aloul and K. A. Sakallah, "SAT using ZBDDs," in Dagstuhl Seminar 01051 on Computer Aided Design and Test -- BDDs versus SAT, Schloss Dagstuhl, Germany, Jan/Feb. 01.
|
| |
3
|
|
| |
4
|
{BS97} R. Bayardo Jr. and R. Schrag, "Using CSP look-back techniques to solve real-world SAT instances," in Proc. Natl. Conf. on Artificial Intelligence, pp. 203--208, 1997.
|
| |
5
|
{BT89} C.L. Berman, and L.H. Trevillyan, "Functional Comparison of Logic Designs for VLSI Circuits", in Proc. Intl. Conf. on Comp.-Aided Design (ICCAD), pp. 456--459, 1989.
|
| |
6
|
|
| |
7
|
|
| |
8
|
|
| |
9
|
{CA93} S. Chakradhar, V. D. Agrawal, and S. Rothweiler, "A transitive closure algorithm for test generation," IEEE Trans. on CAD, vol. 12, pp. 1015--1028, July 1993.
|
| |
10
|
|
| |
11
|
|
 |
12
|
|
 |
13
|
|
| |
14
|
{FS83} H. Fujiwara and T. Shimono, "On the acceleration of test generation algorithms," IEEE Trans. on Comp., pp. 1137--1144, Dec. 1983.
|
 |
15
|
Malay K. Ganai , Pranav Ashar , Aarti Gupta , Lintao Zhang , Sharad Malik, Combining strengths of circuit-based and CNF-based algorithms for a high-performance SAT solver, Proceedings of the 39th conference on Design automation, June 10-14, 2002, New Orleans, Louisiana, USA
[doi> 10.1145/513918.514105]
|
| |
16
|
|
| |
17
|
|
| |
18
|
{Go81} P. Goel, "An implicit enumeration algorithm to generate tests for combinational logic circuits," IEEE Trans. on Comp., vol. C-30, pp. 215--222, March 1981.
|
 |
19
|
Jawahar Jain , Rajarshi Mukherjee , Masahiro Fujita, Advanced verification techniques based on learning, Proceedings of the 32nd ACM/IEEE conference on Design automation, p.420-426, June 12-16, 1995, San Francisco, California, United States
[doi> 10.1145/217474.217564]
|
 |
20
|
|
| |
21
|
|
 |
22
|
|
 |
23
|
|
| |
24
|
|
| |
25
|
|
| |
26
|
|
| |
27
|
{La89} T. Larrabee, "Efficient generation of test patterns using Boolean difference," in Proc. Intl. Test Conference, pp. 795--801, 1989.
|
| |
28
|
|
| |
29
|
|
| |
30
|
|
| |
31
|
{MW85} S. Mallela and S. Wu, "A sequential circuit test generation system," in Proc. Intl. Test Conf., pp. 57--61, 1985.
|
 |
32
|
|
| |
33
|
|
 |
34
|
|
 |
35
|
Matthew W. Moskewicz , Conor F. Madigan , Ying Zhao , Lintao Zhang , Sharad Malik, Chaff: engineering an efficient SAT solver, Proceedings of the 38th conference on Design automation, p.530-535, June 2001, Las Vegas, Nevada, United States
[doi> 10.1145/378239.379017]
|
| |
36
|
{RC90} J. Rajski and H. Cox, "A method to calculate necessary assignments in algorithmic test pattern generation," in Proc. Intl. Test Conference, pp. 25--34, 1990.
|
| |
37
|
{Ro66} J. P. Roth, "Diagnosis of automata failures: A calculus and a method," IBM Journal of Research and Development, vol. 10, pp. 278--291, July 1966.
|
| |
38
|
{SA89} M. Schulz and E. Auth, "Improved deterministic test pattern generation with applications to redundancy identification," IEEE Trans. on CAD, vol. 8, pp. 811--816, July 1989.
|
| |
39
|
{St89} G. Stålmarck, "A system for determining propositional logic theorems by applying values and rules to triplets that are generated from a formula," 1989, Swedish Patent 467 076, US Patent 5 276 897, European Patent 0 403454.
|
| |
40
|
{SB96} P. Stephan, R. Brayton, and A. Sangiovanni-Vincentelli, "Combinational test generation using satisfiability," IEEE Trans. on CAD, 1996.
|
| |
41
|
|
| |
42
|
{TG00} P. Tafertshofer, A. Ganz, and K. Antreich, "Igraine - an implication graph based engine for fast implication, justification, and propagation," IEEE Trans. on CAD, vol. 19, pp. 907--927, August 2000.
|
| |
43
|
{Ts70} G.S. Tseitin, "On the Complexity of Derivation in Propositional Calculus", in A.O. Slikenko (Ed.): Studies in Constructive Mathematics and Mathematical Logic
|
 |
44
|
Chen Wang , Sudhakar M. Reddy , Irith Pomeranz , Xijiang Lin , Janusz Rajski, Conflict driven techniques for improving deterministic test pattern generation, Proceedings of the 2002 IEEE/ACM international conference on Computer-aided design, p.87-93, November 10-14, 2002, San Jose, California
[doi> 10.1145/774572.774585]
|
| |
45
|
|
CITED BY 3
|
|
G. Parthasarathy , M. K. Iyer , K.-T. Cheng , Li. C. Wang, Efficient reachability checking using sequential SAT, Proceedings of the 2004 conference on Asia South Pacific design automation: electronic design and solution fair, p.418-423, January 27-30, 2004, Yokohama, Japan
|
|
|
|
|
|
|
|