ACM Home Page
Please provide us with feedback. Feedback
A Markov chain sequence generator for power macromodeling
Full text PdfPdf (389 KB)
Source International Conference on Computer Aided Design archive
Proceedings of the 2002 IEEE/ACM international conference on Computer-aided design table of contents
San Jose, California
Pages: 404 - 411  
Year of Publication: 2002
ISBN ~ ISSN:1092-3152 , 0-7803-7607-2
Authors
Xun Liu  University of Michigan, Ann Arbor, Michigan
Marios C. Papaefthymiou  University of Michigan, Ann Arbor, Michigan
Sponsors
: IEEE Circuits & Systems Society
IEEE-CS\DATC : IEEE Computer Society
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 4,   Downloads (12 Months): 41,   Citation Count: 3
Additional Information:

abstract   references   cited by   index terms   collaborative colleagues  

Tools and Actions: Review this Article  
DOI Bookmark: Use this link to bookmark this Article: http://doi.acm.org/10.1145/774572.774632
What is a DOI?

ABSTRACT

In this paper, we present a novel sequence generator based on a Markov chain model. Specifically, we formulate the problem of generating a sequence of vectors with given average input probability p, average transition density d, and spatial correlation s as a transition matrix computation problem, in which the matrix elements are subject to constraints derived from the specified statistics. We also give a practical heuristic that computes such a matrix and generates a sequence of l n-bit vectors in O(nl + n2) time. Derived from a strongly mixing Markov chain, our generator yields binary vector sequences with accurate statistics, high uniformity, and high randomness. Experimental results show that our sequence generator can cover more than 99% of the parameter space. Sequences of 2,000 48-bit vectors are generated in less than 0.05 seconds, with average deviations of the signal statistics p, d, and s equal to 1.6%, 1.8%, and 2.8%, respectively.Our generator enables the detailed study of power macromodeling. Using our tool and the ISCAS-85 benchmark circuits, we have assessed the sensitivity of power dissipation to the three input statistics p, d, and s. Our investigation reveals that power is most sensitive to transition density, while only occasionally exhibiting high sensitivity to signal probability and spatial correlation. Our experiments also show that input signal imbalance can cause estimation errors as high as 100% in extreme cases, although errors are usually within 25%.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
M. Abramovici, M. A. Breuer, and A. D. Friedman. Digital Systems Tesing and Testable Design. IEEE Press, Piscataway, NJ, 1995.
 
2
V. D. Agrawal and S. C. Seth. Test Generation for VLSI Chips. Computer Society Press, Washington D.C., 1988.
 
3
 
4
 
5
 
6
 
7
R. Burch, F. Najm, P. Yang, and T. Trick. A Monte-Carlo approach for power estimation. In IEEE Trans. VLSI Systems, pages 63--71, January 1993.
8
 
9
 
10
 
11
12
 
13
 
14
S. Gupta. Power macromodeling for high level power estimation. Master Thesis, Univ. of Illinois, September 1997.
15
 
16
 
17
 
18
P. Landman and J. Rabaey. Activity-sensitive architectural power analysis. In IEEE Trans. CAD, pages 571--587, June 1996.
 
19
 
20
D. Marculescu, R. Marculescu, and M. Pedram. Information theoretic measures for power analysis. In IEEE Trans. CAD, pages 599--609, June 1996.
21
 
22
R. Marculescu, D. Marculescu, and M. Pedram. Sequence compaction for power estimation: Theory and practice. In IEEE Trans. CAD, pages 973--993, July 1999.
 
23
 
24
 
25
 
26


Collaborative Colleagues:
Xun Liu: colleagues
Marios C. Papaefthymiou: colleagues