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Sub-90nm technologies: challenges and opportunities for CAD
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Source International Conference on Computer Aided Design archive
Proceedings of the 2002 IEEE/ACM international conference on Computer-aided design table of contents
San Jose, California
Pages: 203 - 206  
Year of Publication: 2002
ISBN ~ ISSN:1092-3152 , 0-7803-7607-2
Authors
Tanay Karnik  Intel Labs, Hillsboro, OR
Shekhar Borkar  Intel Labs, Hillsboro, OR
Vivek De  Intel Labs, Hillsboro, OR
Sponsors
: IEEE Circuits & Systems Society
IEEE-CS\DATC : IEEE Computer Society
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 13,   Downloads (12 Months): 74,   Citation Count: 22
Additional Information:

appendices and supplements   abstract   references   cited by   index terms   collaborative colleagues  

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APPENDICES and SUPPLEMENTS
Zipa203-karnik.zip (48.11 MB)
Presentations from the 2002 ICCAD conference: Innovative design challenges


ABSTRACT

Future high performance microprocessor design with technology scaling beyond 90nm will pose two major challenges: (1) energy and power, and (2) parameter variations. Design practice will have to change from deterministic design to probabilistic and statistical design. This paper discusses circuit techniques and design automation opportunities to overcome the challenges.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
Pollack F., New Microarchitecture Challenges in the Coming Generations of CMOS Process Technologies; Micro32, 1999.
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Tschanz, J., et al., "Design optimizations of a high performance microprocessor using combinations of dual-Vt allocation and transistor sizing", VLSI Circuits Symposium 2001, pp. 218--219.
 
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Kuroda, T., et al., Low-power CMOS digital design with dual embedded adaptive power supplies. JSSC, Vol. 35, Issue 4, April 2000, pp. 652--655.
 
9
Krishnamurthy, R., et al., High-performance and low-power challenges for sub-70nm microprocessor circuits. CICC 2002, pp. 125--128.
 
10
Keshavarzi, A., et al., Forward body bias for uPs in 130nm technology generation and beyond. VLSI Circuits Symp. 2002, pp. 125--128.

CITED BY  22

Collaborative Colleagues:
Tanay Karnik: colleagues
Shekhar Borkar: colleagues
Vivek De: colleagues