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Managing power and performance for System-on-Chip designs using Voltage Islands
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Source International Conference on Computer Aided Design archive
Proceedings of the 2002 IEEE/ACM international conference on Computer-aided design table of contents
San Jose, California
Pages: 195 - 202  
Year of Publication: 2002
ISBN ~ ISSN:1092-3152 , 0-7803-7607-2
Authors
David E. Lackey  IBM Microelectronics Division, Essex Junction, Vermont
Paul S. Zuchowski  IBM Microelectronics Division, Essex Junction, Vermont
Thomas R. Bednar  IBM Microelectronics Division, Essex Junction, Vermont
Douglas W. Stout  IBM Microelectronics Division, Essex Junction, Vermont
Scott W. Gould  IBM Microelectronics Division, Essex Junction, Vermont
John M. Cohn  IBM Microelectronics Division, Essex Junction, Vermont
Sponsors
: IEEE Circuits & Systems Society
IEEE-CS\DATC : IEEE Computer Society
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 21,   Downloads (12 Months): 126,   Citation Count: 48
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ABSTRACT

This paper discusses Voltage Islands, a system architecture and chip implementation methodology, that can be used to dramatically reduce active and static power consumption for System-on-Chip (SoC) designs. As technology scales for increased circuit density and performance, the need to reduce power consumption increases in significance as designers strive to utilize the advancing silicon capabilities. The consumer product market further drives the need to minimize chip power consumption.Effective use of Voltage Islands for meeting SoC power and performance requirements, while meeting Time to Market (TAT) demands, requires novel approaches throughout the design flow as well as special circuit components and chip powering structures. This paper outlines methods being used today to design Voltage Islands in a rapid-TAT product development environment, and discusses the need for industry EDA advances to create an industry-wide Voltage Island design capability.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
Enomoto, E., "Low Power Design Technology for Digital LSIs," IEICE Transactions on Electronics v E79-C n 12, Dec. 1996, pp 1639--1649.
 
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3
 
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Adan, A.O. and Higashi K., "OFF-State Leakage Current Mechanisms in BulkSi and SOI MOSFETs and Their Impact on CMOS ULSIs Standby Current," IEEE Transactions on Electron Devices, Vol. 48, No. 9, Sept. 2001, pp 2050--2057.
 
5
Stathis, J.H., "Physical and Predictive Models of Ultra Thin Oxide Reliability in CMOS Devices and Circuits," IEEE 39th Annual International Reliability Physics Symposium, Orlando, Florida, 2001, pp 132--149.
 
6
Nowack, E.J., "Maintaining the Benefits of CMOS Scaling when Scaling Bogs Down," IBM Journal of Research and Development, No. 2/3 March/May 2002.
 
7
Gary, S., "Low Power Microprocessor Design," Low Power Design Methodologies, Kluwer Academic Publishers, 1996, pp 279--281.
 
8
"IC Wizard - The Hierarchical Design Planning Tool," © 2002 Monterey Design Systems, Inc., http://www.mondes.com/prod_icw.html
 
9
"TeraForm® RTL Design Planner for Deep Submicron SOCs," © 2002 Tera Systems, Inc., http://www.terasystems.com/ products/datasheet.htm
 
10
"First Encounter," © 2002 Cadence Design Systems, Inc., http://www.cadence.com/products/first_encounter.html
 
11
1481--1999 IEEE Standard for Integrated Circuit (IC) Delay and Power Calculation System, copyright 1999 by IEEE.
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CITED BY  51

Collaborative Colleagues:
David E. Lackey: colleagues
Paul S. Zuchowski: colleagues
Thomas R. Bednar: colleagues
Douglas W. Stout: colleagues
Scott W. Gould: colleagues
John M. Cohn: colleagues