On undetectable faults in partial scan circuits

ABSTRACT

We provide a definition of undetectable faults in partial scan circuits under a test application scheme where a test consists of primary input vectors applied at-speed between scan operations. We also provide sufficient conditions for a fault to be undetectable under this test application scheme. We present experimental results on finite-state machine benchmarks to demonstrate the effectiveness of these conditions in identifying undetectable faults.

REFERENCES

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INDEX TERMS

Primary Classification:
  G. Mathematics of Computing
  G.2 DISCRETE MATHEMATICS
      G.2.2 Graph Theory
          Subjects: Path and circuit problems

Additional Classification:
  B. Hardware
  B.8 Performance and Reliability
      B.8.1 Reliability, Testing, and Fault-Tolerance

  C. Computer Systems Organization
  C.4 PERFORMANCE OF SYSTEMS
      Subjects: Fault tolerance

  G. Mathematics of Computing
  G.1 NUMERICAL ANALYSIS
      G.1.3 Numerical Linear Algebra
          Subjects: Eigenvalues and eigenvectors (direct and iterative methods)

General Terms:
Experimentation, Measurement, Performance, Theory