Comprehensive frequency-dependent substrate noise analysis using boundary element methods

ABSTRACT

We present a comprehensive methodology for the electrodynamic modeling of substrate noise coupling. A new and efficient method is introduced for the calculation of the Green's function that can accommodate arbitrary substrate doping profiles and thus facilitate substrate noise analysis using boundary element methods. In addition to a discussion of the application of the method and its validation in the context of substrate transfer resistance extraction, preliminary results from its application to frequency-dependent substrate noise modeling are presented also.

REFERENCES

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INDEX TERMS

Primary Classification:
  B. Hardware
  B.7 INTEGRATED CIRCUITS
      B.7.1 Types and Design Styles
          Subjects: Input/output circuits

Additional Classification:
  C. Computer Systems Organization
  C.2 COMPUTER-COMMUNICATION NETWORKS
      C.2.1 Network Architecture and Design
          Subjects: Circuit-switching networks

  G. Mathematics of Computing
  G.2 DISCRETE MATHEMATICS
      G.2.2 Graph Theory
          Subjects: Path and circuit problems

General Terms:
Design, Experimentation, Theory