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Experimental comparison of three system test strategies preliminary report
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Proceedings of the ACM SIGSOFT '89 third symposium on Software testing, analysis, and verification table of contents
Key West, Florida, United States
Pages: 141 - 149  
Year of Publication: 1989
ISBN:0-89791-342-6
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Authors
J. Rowland  University of Wyoming
Y. Zuyuan  Sichuan Institute of Industry
Sponsors
IEEE-CS : Computer Society
SIGSOFT: ACM Special Interest Group on Software Engineering
Publisher
ACM  New York, NY, USA
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Downloads (6 Weeks): 5,   Downloads (12 Months): 26,   Citation Count: 4
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ABSTRACT

This paper reports on some experiments which compare three system test strategies which were applied to artificial software systems. The artificial systems were seeded with known defects and then tested according to the three strategies which involved random system level input, random system level input with defect removal, and modified module coverage. The results suggests that of the three strategies considered here, the modified module coverage exposes a higher number of defects, especially for large systems.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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