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Completely validated software: test adequacy and program mutation (panel session)
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Source International Conference on Software Engineering archive
Proceedings of the 11th international conference on Software engineering table of contents
Pittsburgh, Pennsylvania, United States
Pages: 355 - 356  
Year of Publication: 1989
ISBN:0-8186-1941-4
Author
R. A. DeMillo  Purdue University, West Lafayette, Indiana
Sponsor
SIGSOFT: ACM Special Interest Group on Software Engineering
Publisher
ACM  New York, NY, USA
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Downloads (6 Weeks): 4,   Downloads (12 Months): 17,   Citation Count: 4
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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
R. DeMillo, R. Lipton and F. Sayward, "Program Mutation: A New Approach to Program Testing", Software Testing, InfoTech, 1979.
 
2
W. Howden, "Reliability of the Path Analysis Testing Strategy" IEEE TSE, Vol. SE-2(3), September 1976.
 
3
R. DeMillo, R. Lipton and F. Sayward, "Hints on Test Data Selection" Computer, Vol. 1 l(4), April 1978.
 
4
D. Angluin and T. Budd, "Two Notions of Correctness and Their Relation to Testing" Acta Informatica, Vol. 18(l) November 1982.
 
5
T. Budd, R. DeMillo, R. Lipton and F. Sayward, "Theoretical and Empirical Results in Program Testing" Proc. 9th ACM POPL, January 1980.
 
6
T. Budd, R. DeMillo, R. Lipton and F. Sayward. "The Design of a Prototype Mutation System for Program Testing" Proc. 1978 NCC.
 
7
R. DeMillo, D. Guindi, K. King, W. McCracken, A. Mathur, A. Offutt, "An Overview of the Mothra Software Testing Environment" Proc. 2nd Workshop on Testing, Banff, July 1988.
 
8
A. Acree, T. Budd, R. DeMillo, R. Lipton and F. Sayward, "Mutation Analysis," Georgia Tech Report GIT/ICS-79-08, September 1979.
 
9
 
10
B. Choi et al, "The Mothra Toolset" Proceedings 21 HICSS, January 1989.
 
11
 
12
R. Hamlet, "Testing Program with the Aid of Compilers", IEEE TSE, Vol. SE-3(4), July 1977.
 
13
W. Howden, "Weak Mutation Testing", IEEE TSE, Vol SE-8(2), July 1982.
 
14
 
15
M. Girgis and M Woodward, " An experimental comparison of the Error Exposing Ability of Program Testing Criteria, Proceedings of 1986 Banff Workshop.