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An efficient finite element method for submicron IC capacitance extraction
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Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 26th ACM/IEEE Design Automation Conference table of contents
Las Vegas, Nevada, United States
Pages: 678 - 681  
Year of Publication: 1989
ISBN:0-89791-310-8
Authors
N. P. van der Meijs  Delft University of Technology, Department of Electrical Engineering, Mekelweg 4, 2628 CD Delft, The Netherlands
A. J. van Genderen  Delft University of Technology, Department of Electrical Engineering, Mekelweg 4, 2628 CD Delft, The Netherlands
Sponsors
SIGDA: ACM Special Interest Group on Design Automation
IEEE-CS\TCDA : TC Design Automation
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 12,   Downloads (12 Months): 31,   Citation Count: 5
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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
R.L.M. Dang and N. Shigyo, "Coupling capacitances for twodimensional wires," 1EEE Electron Device Letters EDL-2(8)pp. 196-197 (Aug. 1981).
 
2
W.H. Dierking and J.D. Bastian, "VLSI parasitic capacitance determination by flux tubes," IEEE Circuits and Systems Magazine, pp. 11-18 (Mar. 1982).
 
3
A. Seidl, M. Svoboda, J. Obemdorfer, and W. Rosner, "CAt~AL - A 3-D Capacitance Solver for Support of CAD Systems," IEEE Trans. on CAD CAD-7(5) pp. 549-556 (May 1988).
 
4
R. Guerrieri and A.L Sangiovanni-Vincentelli, "Three Dimensional Capacitance Evaluation on a Connection Machine," Proc. IEEE ICCAD.87, Santa Clara, pp. 446-449 (Nov. 9-11 1987).
 
5
 
6
A.E. Ruehli, "Survey of computer-aided electrical analysis of integrated circuit interconnections," IBM J. Res. Develop. 23(6) pp. 626-639 (Nov. 1979).
 
7
A.E. Ruehli and P.A. Brennan, "Capacitance models for integrated circuit metallization wires," IEEE Journal of Solid- State Circuits SC-10(6) pp. 530-536 (Dec. 1975).
 
8
Z.Q. Ning, P.M. Dewilde, and F.L Neerhoff, "Capacitance Coefficients for VLSI Multilevel Metallization Lines," IEEE Trans. on Electron Devices ED-34(3) pp. 644-649 (March 1987).
 
9
 
10
Z.Q. Ning and P.M. Dewilde, "An Efficient Modelling Technique for Computing the Parasitic Capacitances in VLSI Circuits," Proc, ISCAS-88, pp. I131-1134 (June 1988).
 
11
Z.Q. Ning and P. Dewilde, "SPIDER: Capacitance Modelling for VLSI laterconnectiotas," IEEE Trans. on Computer-Aided Design, to be published, (I 2)(December 1988).
 
12
 
13
H. Dym and I. Gohberg, "Extensions of band matrices with band inverses," Linear algebra and its applications, (36)(1981).
 
14
H. Nelis, E. Deprettere, and P. Dewflde, "Approximate Inversion of Positive Definite Matrices, specified on a Multiple Band," Proc. SPIE 88, San Diego,(Aug. 1988).
 
15
A.J. van Genderen and N.P. van der Meijs, "'Extracting Simple but Accurate RC Modds for VLSI Interconnect," Proc. ISCAS-88, Helsinki, Finland, pp. 2351-2354 (June 7-9, 1988).


Collaborative Colleagues:
N. P. van der Meijs: colleagues
A. J. van Genderen: colleagues