Diagnosing electronics systems by integrating models of normal and abnormal functioning

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Diagnosing electronics systems by integrating models of normal and abnormal functioning

Source

International conference on Industrial and engineering applications of artificial intelligence and expert systems archive
Proceedings of the 2nd international conference on Industrial and engineering applications of artificial intelligence and expert systems - Volume 1 table of contents

Tullahoma, Tennessee, United States

Pages: 79 - 84

Year of Publication: 1989

ISBN:0-89791-320-5

Authors

Scott Bublin	Purdue Univ., W. Lafayette, IN
R. L. Kashyap	Purdue Univ., E. Lafayette, IN

Sponsor

SIGART: ACM Special Interest Group on Artificial Intelligence

Publisher

ACM New York, NY, USA

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ABSTRACT

Current approaches to diagnosis cannot handle novel situations and are inefficient in that they require excessive amounts of test data to isolate a fault. This paper presents a problem-solving method that combines an experientially-based abnormal model of device operation with a functionality-based model of normal operation. The CONSOLIDATE system has been constructed in SMALLTALK-80, and an television diagnosis application has been developed.

INDEX TERMS

Primary Classification:
J. Computer Applications
J.2 PHYSICAL SCIENCES AND ENGINEERING
Subjects: Electronics