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From symptom to cause: localizing errors in counterexample traces
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Source ACM SIGPLAN Notices archive
Volume 38 ,  Issue 1  (January 2003) table of contents
Pages: 97 - 105  
Year of Publication: 2003
ISSN:0362-1340
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Authors
Thomas Ball  Microsoft Research
Mayur Naik  Purdue University
Sriram K. Rajamani  Microsoft Research
Publisher
ACM  New York, NY, USA
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ABSTRACT

There is significant room for improving users' experiences with model checking tools. An error trace produced by a model checker can be lengthy and is indicative of a symptom of an error. As a result, users can spend considerable time examining an error trace in order to understand the cause of the error. Moreover, even state-of-the-art model checkers provide an experience akin to that provided by parsers before syntactic error recovery was invented: they report a single error trace per run. The user has to fix the error and run the model checker again to find more error traces.We present an algorithm that exploits the existence of correct traces in order to localize the error cause in an error trace, report a single error trace per error cause, and generate multiple error traces having independent causes. We have implemented this algorithm in the context of slam, a software model checker that automatically verifies temporal safety properties of C programs, and report on our experience using it to find and localize errors in device drivers. The algorithm typically narrows the location of a cause down to a few lines, even in traces consisting of hundreds of statements.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

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A. Groce and W. Visser. What went wrong: Explaining counterexamples. Technical Report 02-08, RIACS, USRA, 2002.
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M. Weiser. Program slicing. IEEE Transactions on Software Engineering, SE-10(4):352--357, July 1984.
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CITED BY  24

Collaborative Colleagues:
Thomas Ball: colleagues
Mayur Naik: colleagues
Sriram K. Rajamani: colleagues