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A signal analysis of network traffic anomalies
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Source Internet Measurement Conference archive
Proceedings of the 2nd ACM SIGCOMM Workshop on Internet measurment table of contents
Marseille, France
SESSION: Session 3: inference and statistical analysis table of contents
Pages: 71 - 82  
Year of Publication: 2002
ISBN:1-58113-603-X
Authors
Paul Barford  University of Wisconsin, Madison
Jeffery Kline  University of Wisconsin, Madison
David Plonka  University of Wisconsin, Madison
Amos Ron  University of Wisconsin, Madison
Sponsor
SIGCOMM: ACM Special Interest Group on Data Communication
Publisher
ACM  New York, NY, USA
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ABSTRACT

Identifying anomalies rapidly and accurately is critical to the efficient operation of large computer networks. Accurately characterizing important classes of anomalies greatly facilitates their identification; however, the subtleties and complexities of anomalous traffic can easily confound this process. In this paper we report results of signal analysis of four classes of network traffic anomalies: outages, flash crowds, attacks and measurement failures. Data for this study consists of IP flow and SNMP measurements collected over a six month period at the border router of a large university. Our results show that wavelet filters are quite effective at exposing the details of both ambient and anomalous traffic. Specifically, we show that a pseudo-spline filter tuned at specific aggregation levels will expose distinct characteristics of each class of anomaly. We show that an effective way of exposing anomalies is via the detection of a sharp increase in the local variance of the filtered data. We evaluate traffic anomaly signals at different points within a network based on topological distance from the anomaly source or destination. We show that anomalies can be exposed effectively even when aggregated with a large amount of additional traffic. We also compare the difference between the same traffic anomaly signals as seen in SNMP and IP flow data, and show that the more coarse-grained SNMP data can also be used to expose anomalies effectively.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

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CITED BY  74

Collaborative Colleagues:
Paul Barford: colleagues
Jeffery Kline: colleagues
David Plonka: colleagues
Amos Ron: colleagues