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Data memory design considering effective bitwidth for low-energy embedded systems
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Source International Symposium on Systems Synthesis archive
Proceedings of the 15th international symposium on System Synthesis table of contents
Kyoto, Japan
SESSION: Low power memory system table of contents
Pages: 201 - 206  
Year of Publication: 2002
ISBN:1-58113-576-9
Authors
Yun Cao  Kyushu University, Fukuoka 816-8580, Japan
Hiroyuki Tomiyama  Institute of Systems & Information Technologies, Momochihama, Fukuoka 814-0001, Japan
Takanori Okuma  Kyushu University, Fukuoka 816-8580, Japan
Hiroto Yasuura  Kyushu University, Fukuoka 816-8580, Japan
Sponsors
SIGDA: ACM Special Interest Group on Design Automation
IEEE-CS\DATC : IEEE Computer Society
ACM: Association for Computing Machinery
Publisher
ACM  New York, NY, USA
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Downloads (6 Weeks): 5,   Downloads (12 Months): 30,   Citation Count: 9
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ABSTRACT

This paper presents a novel low-energy memory design technique, considering effective bitwidth of variables for application-specific systems, called VAbM technique. It targets the exploitation of both data locality and effective bitwidth of variables to reduce energy consumed by redundant bits. Under constraints of the number of memory banks, the VAbM technique use variable analysis results to perform allocating and assigning on-chip RAM into multiple memory banks, which have different size with different number of word lines and different number of bit lines tailored to each application requirements. Experimental results with several real embedded applications demonstrate significant energy reduction up to 64.8% over monolithic memory, and 18.4% over memory designed by banking technique.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

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A.Inoue, H.Tomiyama, T.Okuma, H.Kanbara, and H.Yasuura, "Language and Compiler for Optimizing Datapath Width of Embedded Systems". IEICE Trans. Fundamentals, Vol. E81-A, No.12, pp. 2595--2604, Dec. 1998.
 
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CITED BY  9

Collaborative Colleagues:
Yun Cao: colleagues
Hiroyuki Tomiyama: colleagues
Takanori Okuma: colleagues
Hiroto Yasuura: colleagues