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Estimation of state line statistics in sequential circuits
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Source ACM Transactions on Design Automation of Electronic Systems (TODAES) archive
Volume 7 ,  Issue 3  (July 2002) table of contents
Pages: 455 - 473  
Year of Publication: 2002
ISSN:1084-4309
Authors
Vikram Saxena  University of Illinois at Urbana-Champaign, Schaumburg, IL
Farid N. Najm  University of Illinois at Urbana-Champaign, Toronto, Ontario, Canada
Ibrahim N. Hajj  University of Illinois at Urbana-Champaign, Beirut, Lebnon
Publisher
ACM  New York, NY, USA
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ABSTRACT

In this article, we present a simulation-based technique for estimation of signal statistics (switching activity and signal probability) at the flip-flop output nodes (state signals) of a general sequential circuit. Apart from providing an estimate of the power consumed by the flip-flops, this information is needed for calculating power in the combinational portion of the circuit. The statistics are computed by collecting samples obtained from fast RTL simulation of the circuit under input sequences that are either randomly generated or independently selected from user-specified pattern sets. An important advantage of this approach is that the desired accuracy can be specified up front by the user; with some approximation, the algorithm iterates until the specified accuracy is achieved. This approach has been implemented and tested on a number of sequential circuits and has been shown to handle very large sequential circuits that can not be handled by other existing methods, while using a reasonable amount of CPU time and memory (the circuit s38584.1, with 1426 flip-flops, can be analyzed in about 10 minutes).


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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Brglez, F., Bryan, D., and Kozminski, K. 1989. Combinational profiles of sequential benchmark circuits. In Proceedings of the IEEE International Symposium on Circuits and Systems, 1929--1934.
 
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Miller, I. R. and Johnson, R. 1990. Probability and Statistics for Engineers, 4th ed., Prentice-Hall, Englewood Cliffs, N.J.
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Najm, F. 1993a. Statistical estimation of the signal probability in VLSI circuits. Tech. Rep. #UILU-ENG-93-2211, DAC-37, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign.
 
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Najm, F. 1993b. Transition density : A new measure of activity in digital circuits. IEEE Trans. Comput. Aided Des. 12, 2 (Feb.), 310--323.
 
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Papoulis, A. 1984. Probability, Random Variables, and Stochastic Processes, 2nd ed., McGraw-Hill, New York.
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Collaborative Colleagues:
Vikram Saxena: colleagues
Farid N. Najm: colleagues
Ibrahim N. Hajj: colleagues