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Level set surface editing operators
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Proceedings of the 29th annual conference on Computer graphics and interactive techniques table of contents
San Antonio, Texas
SESSION: Geometry table of contents
Pages: 330 - 338  
Year of Publication: 2002
ISBN ~ ISSN:0730-0301 , 1-58113-521-1
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Authors
Ken Museth  California Institute of Technology
David E. Breen  California Institute of Technology
Ross T. Whitaker  University of Utah
Alan H. Barr  California Institute of Technology
Sponsor
SIGGRAPH: ACM Special Interest Group on Computer Graphics and Interactive Techniques
Publisher
ACM  New York, NY, USA
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Downloads (6 Weeks): 20,   Downloads (12 Months): 112,   Citation Count: 36
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ABSTRACT

We present a level set framework for implementing editing operators for surfaces. Level set models are deformable implicit surfaces where the deformation of the surface is controlled by a speed function in the level set partial differential equation. In this paper we define a collection of speed functions that produce a set of surface editing operators. The speed functions describe the velocity at each point on the evolving surface in the direction of the surface normal. All of the information needed to deform a surface is encapsulated in the speed function, providing a simple, unified computational framework. The user combines pre-defined building blocks to create the desired speed function. The surface editing operators are quickly computed and may be applied both regionally and globally. The level set framework offers several advantages. 1) By construction, self-intersection cannot occur, which guarantees the generation of physically-realizable, simple, closed surfaces. 2) Level set models easily change topological genus, and 3) are free of the edge connectivity and mesh quality problems associated with mesh models. We present five examples of surface editing operators: blending, smoothing, sharpening, openings/closings and embossing. We demonstrate their effectiveness on several scanned objects and scan-converted models.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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CITED BY  36

Collaborative Colleagues:
Ken Museth: colleagues
David E. Breen: colleagues
Ross T. Whitaker: colleagues
Alan H. Barr: colleagues