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Projected state machine coverage for software testing
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Proceedings of the 2002 ACM SIGSOFT international symposium on Software testing and analysis table of contents
Roma, Italy
SESSION: Specification-based testing table of contents
Pages: 134 - 143  
Year of Publication: 2002
ISBN ~ ISSN:0163-5948 , 1-58113-562-9
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Authors
G. Friedman  Technion Israel Institute of Technology, Technion City, Haifa, ISRAEL
A. Hartman  IBM Haifa Research Laboratory, Haifa, ISRAEL
K. Nagin  IBM Haifa Research Laboratory, Haifa, ISRAEL
T. Shiran  IBM Haifa Research Laboratory, Haifa, ISRAEL
Sponsor
SIGSOFT: ACM Special Interest Group on Software Engineering
Publisher
ACM  New York, NY, USA
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ABSTRACT

Our research deals with test generation for software based on finite state machine (FSM) models of the program specification. We describe a set of coverage criteria and testing constraints for use in the automatic generation of test suites. We also describe the algorithms used to generate test suites based on these coverage criteria, and the implementation of these algorithms as an extension of the Murϕ model checker[4]. The coverage criteria are simple but powerful in that they generate test suites of high quality and moderate volume, without requiring the user to have a sophisticated grasp of the test generation technology. The testing constraints are used to combat the endemic problem of state explosion, typically encountered in FSM techniques. We illustrate our techniques on several well-known problems from the literature and describe two industrial trials, to demonstrate the validity of our claims.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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Hartman, A., and Nagin, K. M., GOTCHA-TCBeans Tool Overview, Release 3.0.2, 2001 http://www.haifa.il.ibm.com/projects/verification/gtcb/documentation.html.
 
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Dill, D., Murϕ Description Language and Verifier, http://sprout.stanford.edu/dill/murphi.html.
 
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Farchi, E., Hartman, A., and Pinter, S. S. Using a model-based test generator to test for standards conformance. IBM Systems Journal 41 (2002) 89-110.
 
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Henniger, O., and Ural, H., Test generation based on control and data dependencies within multi-process SDL specifications. Proceedings of the 2nd Workshop of the SDL Forum Society on SDL and MSC (2000).
 
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Collaborative Colleagues:
G. Friedman: colleagues
A. Hartman: colleagues
K. Nagin: colleagues
T. Shiran: colleagues