Dispatching heuristic for wafer fabrication

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Dispatching heuristic for wafer fabrication

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Winter Simulation Conference archive
Proceedings of the 33nd conference on Winter simulation table of contents

Arlington, Virginia

SESSION: Semiconductor manufacturing table of contents

Pages: 1215 - 1219

Year of Publication: 2001

ISBN:0-7803-7309-X

Authors

Loo Hay Lee	National University of Singapore, Kent Ridge, Singapore 119260 SINGAPORE
Loon Ching Tang	National University of Singapore, Kent Ridge, Singapore 119260 SINGAPORE
Soon Chee Chan	National University of Singapore, Kent Ridge, Singapore 119260 SINGAPORE

Sponsors

INFORMS/CS : Institute for Operations Research and the Management Sciences/College on Simulation
IEEE/SMCS : Institute of Electrical and Electronics Engineers/Systems, Man, and Cybernetics Society
NIST : National Institute of Standards and Technology
ACM: Association for Computing Machinery
SCS : The Society for Computer Simulation International
SIGSIM: ACM Special Interest Group on Simulation and Modeling
IIE : Institute of Industrial Engineers
IEEE/CS : Institute of Electrical and Electronics Engineers/Computer Society
ASA : American Statistical Association

Publisher

IEEE Computer Society Washington, DC, USA

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ABSTRACT

As the semiconductor industry moves into the next millennium, companies increasingly will be faced with production obstacles that impede their ability to remain competitive. Effective equipment and line management planning will increasingly be required to maximize profitability while maintaining the flexibility to keep pace with rapidly changing manufacturing environment. In this paper, the authors present a two-bottleneck machines center model for wafer operations analysis. A new dispatching rule Balance Work Content, BWC, is introduced. This is a selective dispatching rule whereby it attempts to maximize the utilization of bottleneck machine. A systematic approach to assessing the impact of BWC is presented. Extensive simulation runs on both the deterministic and stochastic models developed shows its supremacy over conventional approaches of FIFO and SPT.

REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

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