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A hierarchical symptom classification for model based causal reasoning
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Source International conference on Industrial and engineering applications of artificial intelligence and expert systems archive
Proceedings of the 1st international conference on Industrial and engineering applications of artificial intelligence and expert systems - Volume 1 table of contents
Tullahoma, Tennessee, United States
Pages: 54 - 59  
Year of Publication: 1988
ISBN:0-89791-271-3
Authors
C. Lee  Siemens Research and Technology Labs, Princeton, NJ
P. Liu  Siemens Research and Technology Labs, Princeton, NJ
S. Clark  Siemens Research and Technology Labs, Princeton, NJ
M. Y. Chiu  Siemens Research and Technology Labs, Princeton, NJ
Sponsor
SIGART: ACM Special Interest Group on Artificial Intelligence
Publisher
ACM  New York, NY, USA
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ABSTRACT

Model based causal reasoning has been widely used for physical systems diagnosis. The system fault is localized with the causal relation of system structure and behavior. In such applications, if the system fault is not localized with the observed behavior, then a subsequent observation is made. This research studies a hierarchical symptom classification for guiding a subsequent observation in model based causal reasoning. The diagnostic symptoms are mapped to the system functional hierarchy and the symptoms are classified by partitioning the functional hierarchy. The dependency relation of symptoms guides subsequent observation. This strategy enhances the control of subsequent observation by hierarchically structuring and classifying the symptoms.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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C.N. Lee, P. Liu and M. Y. Chiu, "Dynamic Causal Model Construction for Model Based Reasoning," Proceedings IEEE Expert Systems Conference WESTEX-87, 90-95, 1987
 
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C. N. Lee, M. Y. Chiu, P. Liu and S. J. Clark, "Model Based Hierarchical Diagnosis of Robotic Assembly Cell," Proceedings SPiE 6th Intelligent Robots and Computer Vision, Vol. 848, 182-189, 1987
 
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A. V. Aho and J. D. Ullman, "Automatic Construction of Efficient Parsers," in Principles of Compiler Design, Addison Wesley Publishing Co. Reading, Massachusetts, 198-245, 1979
 
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Collaborative Colleagues:
C. Lee: colleagues
P. Liu: colleagues
S. Clark: colleagues
M. Y. Chiu: colleagues