ACM Home Page
Please provide us with feedback. Feedback
Coping with buffer delay change due to power and ground noise
Full text PdfPdf (314 KB)
Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 39th annual Design Automation Conference table of contents
New Orleans, Louisiana, USA
SESSION: Circuit effects in static timing table of contents
Pages: 860 - 865  
Year of Publication: 2002
ISBN ~ ISSN:0738-100X , 1-58113-461-4
Authors
Lauren Hui Chen  Avant! Corp., Fremont, CA
Malgorzata Marek-Sadowska  University of California, Santa Barbara, CA
Forrest Brewer  University of California, Santa Barbara, CA
Sponsor
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 4,   Downloads (12 Months): 29,   Citation Count: 13
Additional Information:

abstract   references   cited by   index terms   collaborative colleagues  

Tools and Actions: Request Permissions Request Permissions    Review this Article  
DOI Bookmark: Use this link to bookmark this Article: http://doi.acm.org/10.1145/513918.514131
What is a DOI?

ABSTRACT

Variation of power and ground levels affect VLSI circuit performance. Trends in device technology and in packaging have necessitated a revision in conventional delay models. In particular, simple scalable models are needed to predict delays in the presence of uncorrelated power and ground noise. In this paper, we analyze the effect of such noise on signal propagation through a buffer and present simple, closed-form formulas to estimate the corresponding change of delay. The model captures both positive (slowdown) and negative (speedup) delay changes. It is consistent with short-channel MOSFET behavior, including carrier velocity saturation effects. An application shows that repeater chains using buffers instead of inherently faster inverters tend to have superior supply level-induced jitter characteristics.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
C. J. Alpert, A. Devgan, S. T. Quay, Buffer insertion for noise and delay optimization, IEEE Trans. on Computer-Aided Design of Integrated Circuits and Systems, vol.18, no.11, Nov.1999, pp.1633--45
 
2
 
3
H. H. Chen and J. S. Neely, Interconnect and circuit modeling techniques for full-chip power supply noise analysis, IEEE Trans. on Components, Packaging, and Manufacturing Technology-Part B, vol.21, no.3, Aug.1998, pp.209--215
 
4
N. Hedenstierna and K. O. Jeppson, CMOS circuit speed and buffer optimization, IEEE Trans. Computer-Aided Design, vol.CAD-6, no.2, pp.270--280, Mar.1987
 
5
 
6
A. Kabbani and A. J. Al-Khalili, Estimation of ground bounce effects on CMOS circuits, IEEE Trans. on Components and Packaging Technology, vol.22, no.2, June 1999, pp.316--325
 
7
J. Lillis, C. K. Cheng, and T.-T. Y. Lin, Optimal wire sizing and buffer insertion for low power and a generalized delay model, IEEE Journal of Solid-State Circuits, vol.31, no.3, March 1996, pp.437--47
 
8
J. Qian, S. Pullela, and L. Pillage, Modeling the effective capacitance for the RC interconnect of CMOS gates, IEEE Trans. on CAD, vol.13, no.12, Dec.1994
 
9
T. Sakurai and A.R. Newton, Alpha-power law MOSFET model and its applications to CMOS inverter delay and other formulas, IEEE Journal of Solid-State Circuits, vol.25, no.2, April 1990, pp.584--594
 
10
R. Saleh, S. Z. Hussain, S. Rochel, and D. Overhauser, Clock skew verification in the presence of IR-drop in the power distribution network, IEEE Trans. on Computer-Aided Design of Integrated Circuits and Systems, vol.19, no.6, June 2000, pp.635--644
 
11
 
12
Y. Yang and J.R. Brews, Design for velocity saturated, short-channel CMOS drivers with simultaneous switching noise and switching time considerations, IEEE Journal of Solid-State Circuits, vol.31, no.9, September 1996, pp.1357--1360

CITED BY  13

Collaborative Colleagues:
Lauren Hui Chen: colleagues
Malgorzata Marek-Sadowska: colleagues
Forrest Brewer: colleagues