| HSpeedEx: a high-speed extractor for substrate noise analysis in complex mixed signal SOC |
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Annual ACM IEEE Design Automation Conference
archive
Proceedings of the 39th annual Design Automation Conference
table of contents
New Orleans, Louisiana, USA
SESSION: Inductance and substrate analysis
table of contents
Pages: 767 - 770
Year of Publication: 2002
ISBN ~ ISSN:0738-100X , 1-58113-461-4
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Authors
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Adil Koukab
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Swiss Federal Institute of Technology (EPFL), Electronics Laboratory CH-1015 Lausanne, Switzerland
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Catherine Dehollain
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Swiss Federal Institute of Technology (EPFL), Lausanne, Switzerland
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Michel Declercq
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Swiss Federal Institute of Technology (EPFL), Lausanne, Switzerland
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| Bibliometrics |
Downloads (6 Weeks): n/a, Downloads (12 Months): n/a, Citation Count: 1
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ABSTRACT
The unprecedented impact of noise coupling on Mixed-Signal Systems-On-a-Chip (MS-SOC) functionality, brings a new set of challenges for Electronics Design Automation (EDA) tool developers. In this paper, we propose a new approach which combines a thorough physical comprehension of the noise coupling effects with an improved Boundary-Element-Method (BEM) to accelerate the substrate model extraction and to avoid the dense matrix storage. The low computational efforts required, as well as speed and accuracy reached, makes this method a highly promising alternative to verify complex MS-SOCs.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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[doi> 10.1145/337292.337766]
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A. Koukab, M. Declercq, and C. Deholain "Analysis and Improvement of the Noise Immunity in a Single-Chip Super-Regenerative Tranceiver" IEE Proc.-Circuits Devices Syst., October 2001, vol. 148, pp 250--254
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INDEX TERMS
Primary Classification:
J.
Computer Applications
J.6
COMPUTER-AIDED ENGINEERING
Subjects:
Computer-aided design (CAD)
General Terms:
Algorithms,
Design,
Theory,
Verification
Keywords:
boundary-element-method,
mixed-signal noise,
noise,
numerical analysis,
substrate coupling,
substrate noise,
supply noise,
switching circuits
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